Abstract
Y2O3:Eu3+luminescent thin films were deposited on quartz fiber substrates using electron beam evaporation technology and then annealed at different temperatures and times. Influences of annealing conditions on surface morphology, structural properties and luminescent properties of the deposited films were studied. The interaction between annealing temperature and time on the microstructure and luminescent intensity of the films was also investigated. Experimental results indicated that the effect of the annealing conditions on the surface morphology of the films was obvious when the films annealed at a high temperature of 1000 °C for 2 or 3 h. Improving crystallization and growing average crystallite size of the films were observed as a result of the increasing annealing temperature and time. The luminescent properties results indicated that the crystalline properties are the important dominant factor affected the luminescent properties of the deposited films and the effective luminescence was detected when the film annealed at 1000 °C for 3 h.
Original language | English |
---|---|
Pages (from-to) | 4113-4118 |
Number of pages | 6 |
Journal | Journal of Materials Science: Materials in Electronics |
Volume | 26 |
Issue number | 6 |
DOIs | |
Publication status | Published - 1 Jun 2015 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering