Wide field, phase measuring confocal microscopy of small particles

N. B E Sawyer, S. P. Morgan, Michael Geoffrey Somekh, C. W. See, B. Y. Shekunov, E. Astrakharchik

Research output: Journal article publicationConference articleAcademic researchpeer-review

Abstract

Amplitude and phase measurements of small particles using a wide field, phase measuring confocal microscope are demonstrated. The wide field confocal capability of the microscope is achieved by illuminating both sample and reference arms of a Linnik interferometer with a moving speckle pattern. In addition a rigorous vector diffraction microscope model based upon Mie scattering theory has been developed. The model is particularly useful as by careful consideration of the scattered and unscattered light, quantitative transmission images can be achieved.
Original languageEnglish
Pages (from-to)638-640
Number of pages3
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4829 II
DOIs
Publication statusPublished - 1 Dec 2003
Externally publishedYes
Event19th Congress of the International Commisssion for Optics Optics for the Quality of Life - Firenze, Italy
Duration: 25 Aug 200230 Aug 2002

Keywords

  • Confocal microscopy
  • Mie scattering
  • Rigorous vector diffraction
  • Small particle

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this