Abstract
Amplitude and phase measurements of small particles using a wide field, phase measuring confocal microscope are demonstrated. The wide field confocal capability of the microscope is achieved by illuminating both sample and reference arms of a Linnik interferometer with a moving speckle pattern. In addition a rigorous vector diffraction microscope model based upon Mie scattering theory has been developed. The model is particularly useful as by careful consideration of the scattered and unscattered light, quantitative transmission images can be achieved.
Original language | English |
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Pages (from-to) | 638-640 |
Number of pages | 3 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 4829 II |
DOIs | |
Publication status | Published - 1 Dec 2003 |
Externally published | Yes |
Event | 19th Congress of the International Commisssion for Optics Optics for the Quality of Life - Firenze, Italy Duration: 25 Aug 2002 → 30 Aug 2002 |
Keywords
- Confocal microscopy
- Mie scattering
- Rigorous vector diffraction
- Small particle
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics