Abstract
We describe a wide-field interferometric surface-plasmon microscope capable of submicrometer resolution. The system is a speckle-illuminated Linnik interferometer, which behaves as a wide-field analog of a scanning heterodyne interferometer. The presented images demonstrate contrast reversals at different defocus while retaining submicrometer lateral resolution. The contrast mechanisms are discussed as well as the instrumental requirements of the technique.
Original language | English |
---|---|
Pages (from-to) | 3110-3112 |
Number of pages | 3 |
Journal | Optics Letters |
Volume | 34 |
Issue number | 20 |
DOIs | |
Publication status | Published - 15 Oct 2009 |
Externally published | Yes |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics