Wide-field high-resolution surface-plasmon interference microscopy

Michael Geoffrey Somekh; Graham Stabler; Shugang Liu; Jing Zhang; Chung W. See

doi:10.1364/OL.34.003110

Wide-field high-resolution surface-plasmon interference microscopy

Michael Geoffrey Somekh, Graham Stabler, Shugang Liu, Jing Zhang, Chung W. See

Research output: Journal article publication › Journal article › Academic research › peer-review

30 Citations (Scopus)

Abstract

We describe a wide-field interferometric surface-plasmon microscope capable of submicrometer resolution. The system is a speckle-illuminated Linnik interferometer, which behaves as a wide-field analog of a scanning heterodyne interferometer. The presented images demonstrate contrast reversals at different defocus while retaining submicrometer lateral resolution. The contrast mechanisms are discussed as well as the instrumental requirements of the technique.

Original language	English
Pages (from-to)	3110-3112
Number of pages	3
Journal	Optics Letters
Volume	34
Issue number	20
DOIs	https://doi.org/10.1364/OL.34.003110
Publication status	Published - 15 Oct 2009
Externally published	Yes

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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10.1364/OL.34.003110

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abstract = "We describe a wide-field interferometric surface-plasmon microscope capable of submicrometer resolution. The system is a speckle-illuminated Linnik interferometer, which behaves as a wide-field analog of a scanning heterodyne interferometer. The presented images demonstrate contrast reversals at different defocus while retaining submicrometer lateral resolution. The contrast mechanisms are discussed as well as the instrumental requirements of the technique.",

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AU - Somekh, Michael Geoffrey

AU - Stabler, Graham

AU - Liu, Shugang

AU - Zhang, Jing

AU - See, Chung W.

PY - 2009/10/15

Y1 - 2009/10/15

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AB - We describe a wide-field interferometric surface-plasmon microscope capable of submicrometer resolution. The system is a speckle-illuminated Linnik interferometer, which behaves as a wide-field analog of a scanning heterodyne interferometer. The presented images demonstrate contrast reversals at different defocus while retaining submicrometer lateral resolution. The contrast mechanisms are discussed as well as the instrumental requirements of the technique.

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DO - 10.1364/OL.34.003110

M3 - Journal article

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JF - Optics Letters

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Wide-field high-resolution surface-plasmon interference microscopy

Abstract

ASJC Scopus subject areas

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