Abstract
This communication describes a wide field phase sensitive confocal optical microscope based on correlation between speckles. We show both experimentally and theoretically that the system operates as a wide field amplitude and phase confocal system; and demonstrate unique modes of operation such as extended focus phase measurement, which have, hitherto, only been demonstrated on scanning systems. Some potential applications of the system are discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 75-80 |
| Number of pages | 6 |
| Journal | Optics Communications |
| Volume | 174 |
| Issue number | 1-4 |
| DOIs | |
| Publication status | Published - 15 Jan 2000 |
| Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Physical and Theoretical Chemistry
- Electrical and Electronic Engineering