Wide field amplitude and phase confocal microscope with speckle illumination

Michael Geoffrey Somekh; C. W. See; J. Goh

doi:10.1016/S0030-4018(99)00657-4

Wide field amplitude and phase confocal microscope with speckle illumination

Michael Geoffrey Somekh, C. W. See, J. Goh

Research output: Journal article publication › Journal article › Academic research › peer-review

51 Citations (Scopus)

Abstract

This communication describes a wide field phase sensitive confocal optical microscope based on correlation between speckles. We show both experimentally and theoretically that the system operates as a wide field amplitude and phase confocal system; and demonstrate unique modes of operation such as extended focus phase measurement, which have, hitherto, only been demonstrated on scanning systems. Some potential applications of the system are discussed.

Original language	English
Pages (from-to)	75-80
Number of pages	6
Journal	Optics Communications
Volume	174
Issue number	1-4
DOIs	https://doi.org/10.1016/S0030-4018(99)00657-4
Publication status	Published - 15 Jan 2000
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Physical and Theoretical Chemistry
Electrical and Electronic Engineering

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10.1016/S0030-4018(99)00657-4

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AU - See, C. W.

AU - Goh, J.

PY - 2000/1/15

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N2 - This communication describes a wide field phase sensitive confocal optical microscope based on correlation between speckles. We show both experimentally and theoretically that the system operates as a wide field amplitude and phase confocal system; and demonstrate unique modes of operation such as extended focus phase measurement, which have, hitherto, only been demonstrated on scanning systems. Some potential applications of the system are discussed.

AB - This communication describes a wide field phase sensitive confocal optical microscope based on correlation between speckles. We show both experimentally and theoretically that the system operates as a wide field amplitude and phase confocal system; and demonstrate unique modes of operation such as extended focus phase measurement, which have, hitherto, only been demonstrated on scanning systems. Some potential applications of the system are discussed.

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U2 - 10.1016/S0030-4018(99)00657-4

DO - 10.1016/S0030-4018(99)00657-4

M3 - Journal article

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SP - 75

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JO - Optics Communications

JF - Optics Communications

IS - 1-4

ER -

Wide field amplitude and phase confocal microscope with speckle illumination

Abstract

ASJC Scopus subject areas

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