Visible Metasurfaces for On-Chip Polarimetry

P.C. Wu, J.-W. Chen, C.-W. Yin, Y.-C. Lai, T.L. Chung, C.Y. Liao, B.H. Chen, K.-W. Lee, C.-J. Chuang, C.-M. Wang, Din-ping Tsai

Research output: Journal article publicationJournal articleAcademic researchpeer-review

48 Citations (Scopus)

Abstract

Copyright © 2017 American Chemical Society.Measuring the polarization state of light and determining the optical properties of chiral materials are inherently complex issues because of the requirement of consequential measurements between different orthogonal states of polarization. Here, we introduce an on-chip polarimetry based on the visible metasurfaces for addressing the issue of polarization analysis with compact components. We demonstrate integrated metasurface chips can effectively determine a set of Stokes parameters covering a broad wave-band at visible light. For the proof of concept, the optical properties of chiral materials are measured using our proposed device, while experimental verifications are convincing by comparing with the data obtained from commercial ellipsometry.
Original languageEnglish
Pages (from-to)2568-2573
Number of pages6
JournalACS Photonics
Volume5
Issue number7
DOIs
Publication statusPublished - 18 Jul 2018
Externally publishedYes

Keywords

  • aluminum plasmonics
  • on-chip polarimetry
  • polarization analysis
  • visible metasurfaces

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Biotechnology
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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