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Van der Waals interface between high-κ dielectrics and 2D semiconductors

  • Jingyu He
  • , Yang Zuo
  • , Tong Yang
  • , Tao Zhu
  • , Ming Yang

Research output: Journal article publicationReview articleAcademic researchpeer-review

Abstract

Atomically thin two-dimensional (2D) semiconductors are attractive channel materials for next-generation field-effect transistors (FETs). The high-performance 2D electronics requires high-quality integration of high-κ dielectrics, which however remains a significant challenge. In this mini-review, we provide a brief introduction on recent progress in the van der Waals (vdW) integration of high-κ dielectrics onto 2D semiconductors. We first highlight the importance of high-κ dielectric integration for 2D FETs. Next, we summarize the recent breakthroughs in the various vdW integrations of high-κ dielectrics with 2D semiconductors, along with their interfaces’ properties. Additionally, we examine the quasi-vdW integration of conventional high-κ dielectrics onto 2D semiconductors. Finally, we discuss the challenges and potential future research directions in this field.

Original languageEnglish
Article number014301
JournalFrontiers of Physics
Volume20
Issue number1
DOIs
Publication statusPublished - Feb 2025

Keywords

  • high-κ dielectrics
  • two-dimensional semiconductor
  • van der Waals interface

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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