Abstract
A new concept of a reference-free impedance method, which does not require direct comparison with a baseline impedance signal, is proposed for damage detection in a plate-like structure. A single pair of piezoelectric (PZT) wafers collocated on both surfaces of a plate are utilized for extracting electro-mechanical signatures (EMS) associated with mode conversion due to damage. A numerical simulation is conducted to investigate the EMS of collocated PZT wafers in the frequency domain at the presence of damage through spectral element analysis. Then, the EMS due to mode conversion induced by damage are extracted using the signal decomposition technique based on the polarization characteristics of the collocated PZT wafers. The effects of the size and the location of damage on the decomposed EMS are investigated as well. Finally, the applicability of the decomposed EMS to the reference-free damage diagnosis is discussed.
| Original language | English |
|---|---|
| Title of host publication | Health Monitoring of Structural and Biological Systems 2010 |
| Volume | 7650 |
| Edition | PART 1 |
| DOIs | |
| Publication status | Published - 18 Jun 2010 |
| Externally published | Yes |
| Event | Health Monitoring of Structural and Biological Systems 2010 - San Diego, CA, United States Duration: 8 Mar 2010 → 11 Mar 2010 |
Conference
| Conference | Health Monitoring of Structural and Biological Systems 2010 |
|---|---|
| Country/Territory | United States |
| City | San Diego, CA |
| Period | 8/03/10 → 11/03/10 |
Keywords
- Collocated piezoelectric wafers
- Electro-mechanical signatures (EMS)
- Lamb waves
- Polarization
- Reference-free impedance method
- Signal decomposition
- Spectral element analysis
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering