Understanding a reference-free impedance method using collocated piezoelectric transducers

Eun Jin Kim, Minkoo Kim, Hoon Sohn, Hyun Woo Park

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

2 Citations (Scopus)

Abstract

A new concept of a reference-free impedance method, which does not require direct comparison with a baseline impedance signal, is proposed for damage detection in a plate-like structure. A single pair of piezoelectric (PZT) wafers collocated on both surfaces of a plate are utilized for extracting electro-mechanical signatures (EMS) associated with mode conversion due to damage. A numerical simulation is conducted to investigate the EMS of collocated PZT wafers in the frequency domain at the presence of damage through spectral element analysis. Then, the EMS due to mode conversion induced by damage are extracted using the signal decomposition technique based on the polarization characteristics of the collocated PZT wafers. The effects of the size and the location of damage on the decomposed EMS are investigated as well. Finally, the applicability of the decomposed EMS to the reference-free damage diagnosis is discussed.
Original languageEnglish
Title of host publicationHealth Monitoring of Structural and Biological Systems 2010
Volume7650
EditionPART 1
DOIs
Publication statusPublished - 18 Jun 2010
Externally publishedYes
EventHealth Monitoring of Structural and Biological Systems 2010 - San Diego, CA, United States
Duration: 8 Mar 201011 Mar 2010

Conference

ConferenceHealth Monitoring of Structural and Biological Systems 2010
CountryUnited States
CitySan Diego, CA
Period8/03/1011/03/10

Keywords

  • Collocated piezoelectric wafers
  • Electro-mechanical signatures (EMS)
  • Lamb waves
  • Polarization
  • Reference-free impedance method
  • Signal decomposition
  • Spectral element analysis

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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