TY - JOUR
T1 - Ultrahigh-resolution optoelectronic vector analysis utilizing photonics-based frequency up-and down-conversions
AU - Xue, Min
AU - Lv, Minghui
AU - Wang, Qi
AU - Yu, Changyuan
AU - Pan, Shilong
N1 - Funding Information:
Manuscript received December 21, 2019; revised February 25, 2020; accepted March 17, 2020. Date of publication March 19, 2020; date of current version July 23, 2020. This work was supported in part by the National Natural Science Foundation of China under Grant 61705103 and Grant 61527820, in part by the National Key R&D Program of China under Grant 2017YFF0106900, in part by the Hong Kong Scholar Program (G-YZ2S), in part by the Jiangsu Provincial Program for High-level Talents in Six Areas (DZXX-034), and in part by Fundamental Research Funds for the Central Universities under Grants NC2018005. (Corresponding authors: Shilong Pan).
Publisher Copyright:
© 1983-2012 IEEE.
PY - 2020/8/1
Y1 - 2020/8/1
N2 - An ultrahigh-resolution optoelectronic vector analyzer (OEVA) to characterize optoelectronic (O/E) frequency responses of photodetectors is proposed and experimentally demonstrated, which is characterized by potential sub-Hz frequency resolution, doubled frequency range and large dynamic range. A carrier-suppressed optical double-sideband (ODSB) signal generated by modulating two frequency-swept RF signals with a fixed frequency spacing is used as a probe signal, which is then converted into a photocurrent by the photodetector (PD) under test. Comparing the frequency up-and down-conversion components in the generated photocurrent, the O/E frequency responses can be achieved with no need to know the response of the electro-optic modulator and the modulation indices. As the desired components achieved by frequency up-and down-conversion are frequency distinguished from the two RF signals, the proposed OEVA is immune to electromagnetic interference during on-chip measurement. In the experiment, the O/E frequency responses of two high-speed PDs are characterized from 0.1 to 67 GHz using a 25-GHz Mach-Zehnder modulator (MZM). The frequency resolution is up to 200 kHz. Additionally, the measurement error analysis is analyzed, and the noise performance and the dynamic range are experimentally investigated and discussed.
AB - An ultrahigh-resolution optoelectronic vector analyzer (OEVA) to characterize optoelectronic (O/E) frequency responses of photodetectors is proposed and experimentally demonstrated, which is characterized by potential sub-Hz frequency resolution, doubled frequency range and large dynamic range. A carrier-suppressed optical double-sideband (ODSB) signal generated by modulating two frequency-swept RF signals with a fixed frequency spacing is used as a probe signal, which is then converted into a photocurrent by the photodetector (PD) under test. Comparing the frequency up-and down-conversion components in the generated photocurrent, the O/E frequency responses can be achieved with no need to know the response of the electro-optic modulator and the modulation indices. As the desired components achieved by frequency up-and down-conversion are frequency distinguished from the two RF signals, the proposed OEVA is immune to electromagnetic interference during on-chip measurement. In the experiment, the O/E frequency responses of two high-speed PDs are characterized from 0.1 to 67 GHz using a 25-GHz Mach-Zehnder modulator (MZM). The frequency resolution is up to 200 kHz. Additionally, the measurement error analysis is analyzed, and the noise performance and the dynamic range are experimentally investigated and discussed.
KW - measurement techniques
KW - microwave photonics
KW - optical variables measurement
KW - Optoelectronic measurement
UR - http://www.scopus.com/inward/record.url?scp=85090290223&partnerID=8YFLogxK
U2 - 10.1109/JLT.2020.2982066
DO - 10.1109/JLT.2020.2982066
M3 - Journal article
AN - SCOPUS:85090290223
SN - 0733-8724
VL - 38
SP - 3859
EP - 3865
JO - Journal of Lightwave Technology
JF - Journal of Lightwave Technology
IS - 15
M1 - 9042332
ER -