Ultra high density optical recording using a scanning near-field optical microscope

Yuan Ying Lu, Din Ping Tsai, Wen Rei Guo, Sheng Chang Chen, Jia Reuy Liu, Han Ping D. Shieh

Research output: Unpublished conference presentation (presented paper, abstract, poster)Conference presentation (not published in journal/proceeding/book)Academic researchpeer-review

1 Citation (Scopus)

Abstract

Near-field scanning optical microscope (NSOM) system with a bent or a straight optical fiber probe has been successfully developed to perform optical recording on the surface of cyanine (C35H35ClN2O4) dye layer or Ge21Te26Sb53 phase change (PC) thin film. Optical writing bits < 40 nm on the cyanine dye layer of a commercial compact disk-recordable (CD-R) were shown by atomic force microscope (AFM) images of our tapping mode NSOM. For an vertical reflection mode NSOM, both optical writing and reading can be achieved on Ge21Te26Sb53 PC thin film, and the diameter of 500 nm recording bits are shown.

Original languageEnglish
Pages244-248
Number of pages5
DOIs
Publication statusPublished - 26 Jan 1998
Externally publishedYes
EventMiniaturized Systems with Micro-Optics and Micromechanics III - San Jose, CA, United States
Duration: 26 Jan 199827 Jan 1998

Conference

ConferenceMiniaturized Systems with Micro-Optics and Micromechanics III
Country/TerritoryUnited States
CitySan Jose, CA
Period26/01/9827/01/98

Keywords

  • Compact disk-recordable
  • Near-field optical recording
  • Near-field scanning optical microscope
  • Phase change thin film

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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