Ultra high density optical recording using a scanning near-field optical microscope

Yuan Ying Lu; Din Ping Tsai; Wen Rei Guo; Sheng Chang Chen; Jia Reuy Liu; Han Ping D. Shieh

doi:10.1117/12.302401

Ultra high density optical recording using a scanning near-field optical microscope

Yuan Ying Lu, Din Ping Tsai, Wen Rei Guo, Sheng Chang Chen, Jia Reuy Liu, Han Ping D. Shieh

Research output: Unpublished conference presentation (presented paper, abstract, poster) › Conference presentation (not published in journal/proceeding/book) › Academic research › peer-review

1 Citation (Scopus)

Abstract

Near-field scanning optical microscope (NSOM) system with a bent or a straight optical fiber probe has been successfully developed to perform optical recording on the surface of cyanine (C₃₅H₃₅ClN₂O₄) dye layer or Ge₂₁Te₂₆Sb₅₃ phase change (PC) thin film. Optical writing bits < 40 nm on the cyanine dye layer of a commercial compact disk-recordable (CD-R) were shown by atomic force microscope (AFM) images of our tapping mode NSOM. For an vertical reflection mode NSOM, both optical writing and reading can be achieved on Ge₂₁Te₂₆Sb₅₃ PC thin film, and the diameter of 500 nm recording bits are shown.

Original language	English
Pages	244-248
Number of pages	5
DOIs	https://doi.org/10.1117/12.302401
Publication status	Published - 26 Jan 1998
Externally published	Yes
Event	Miniaturized Systems with Micro-Optics and Micromechanics III - San Jose, CA, United States Duration: 26 Jan 1998 → 27 Jan 1998

Conference

Conference	Miniaturized Systems with Micro-Optics and Micromechanics III
Country/Territory	United States
City	San Jose, CA
Period	26/01/98 → 27/01/98

Keywords

Compact disk-recordable
Near-field optical recording
Near-field scanning optical microscope
Phase change thin film

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

More information

10.1117/12.302401

Cite this

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abstract = "Near-field scanning optical microscope (NSOM) system with a bent or a straight optical fiber probe has been successfully developed to perform optical recording on the surface of cyanine (C35H35ClN2O4) dye layer or Ge21Te26Sb53 phase change (PC) thin film. Optical writing bits < 40 nm on the cyanine dye layer of a commercial compact disk-recordable (CD-R) were shown by atomic force microscope (AFM) images of our tapping mode NSOM. For an vertical reflection mode NSOM, both optical writing and reading can be achieved on Ge21Te26Sb53 PC thin film, and the diameter of 500 nm recording bits are shown.",

keywords = "Compact disk-recordable, Near-field optical recording, Near-field scanning optical microscope, Phase change thin film",

author = "Lu, {Yuan Ying} and Tsai, {Din Ping} and Guo, {Wen Rei} and Chen, {Sheng Chang} and Liu, {Jia Reuy} and Shieh, {Han Ping D.}",

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doi = "10.1117/12.302401",

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Ultra high density optical recording using a scanning near-field optical microscope. / Lu, Yuan Ying; Tsai, Din Ping; Guo, Wen Rei et al.
1998. 244-248 Paper presented at Miniaturized Systems with Micro-Optics and Micromechanics III, San Jose, CA, United States.

Research output: Unpublished conference presentation (presented paper, abstract, poster) › Conference presentation (not published in journal/proceeding/book) › Academic research › peer-review

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AU - Lu, Yuan Ying

AU - Tsai, Din Ping

AU - Guo, Wen Rei

AU - Chen, Sheng Chang

AU - Liu, Jia Reuy

AU - Shieh, Han Ping D.

PY - 1998/1/26

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AB - Near-field scanning optical microscope (NSOM) system with a bent or a straight optical fiber probe has been successfully developed to perform optical recording on the surface of cyanine (C35H35ClN2O4) dye layer or Ge21Te26Sb53 phase change (PC) thin film. Optical writing bits < 40 nm on the cyanine dye layer of a commercial compact disk-recordable (CD-R) were shown by atomic force microscope (AFM) images of our tapping mode NSOM. For an vertical reflection mode NSOM, both optical writing and reading can be achieved on Ge21Te26Sb53 PC thin film, and the diameter of 500 nm recording bits are shown.

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KW - Phase change thin film

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M3 - Conference presentation (not published in journal/proceeding/book)

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T2 - Miniaturized Systems with Micro-Optics and Micromechanics III

Y2 - 26 January 1998 through 27 January 1998

ER -

Ultra high density optical recording using a scanning near-field optical microscope

Abstract

Conference

Keywords

ASJC Scopus subject areas

More information

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