Tuning dielectric constant and Young's modulus by nanofabrication

C. Q. Sun, B. K. Tay, Shu Ping Lau, X. W. Sun

Research output: Journal article publicationConference articleAcademic researchpeer-review

2 Citations (Scopus)

Abstract

Understanding the origin, the trend and the scale of the relative change of the mechanical strength and the dielectric properties of a nanometric solid is of great importance in designing solid-state device. Here we present a model that describes the nature and behavior of a nanosolid including spherical dots, wires and ultrathin films. Consistency between predictions and experimental observations confirms that the size-driven property-change originates from the chemical bond contraction at surface and the rise in the surface-to-volume ratio of the nanosolid. It is found that the bond contracts by as high as 14% and the corresponding Young's modulus increase by 100% at surface, and that the dielectric constant of semiconductors decreases with reducing the dimension of the solid, which leads to the blue shift in the photoluminescence and absorption edges.
Original languageEnglish
Pages (from-to)302-308
Number of pages7
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4228
DOIs
Publication statusPublished - 1 Dec 2000
Externally publishedYes
EventDesign, Modeling, and Simulation in Microelectronics - Singapure, Singapore
Duration: 28 Nov 200030 Nov 2000

Keywords

  • Dielectric constant
  • Mechanical strength
  • Nanotechnology
  • Photoluminescence
  • Photon absorption
  • Solid-state device
  • Surface and interface

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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