Tripping characteristics of residual current devices under non-sinusoidal currents

Xiang Luo, Ya Ping Du, X. H. Wong, Mingli Chen

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

Abstract

This paper presented an experimental investigation into operating characteristics of RCDs under an unbalanced current. The unbalanced current included the harmonic current, ground fault current, and surge current. A testing system was first set up in the laboratory, and the minimum value of the current causing RCD samples to trip were recorded. To obtain consistent testing results, RCD samples under test were demagnetized prior to each test. It is found that RCD tripping is primarily determined by the peak value of the unbalanced current. Under a ground fault RCDs installed in healthy circuits may trip. It would be necessary to limit the maximum leakage current in the circuits to avoid such nuisance tripping. Under surge conditions RCDs could withstand a large short-duration current. However, a long-duration surge current can easily cause RCDs to trip.
Original languageEnglish
Title of host publication2010 IEEE Industry Applications Society Annual Meeting, IAS 2010
DOIs
Publication statusPublished - 13 Dec 2010
Event2010 IEEE Industry Applications Society Annual Meeting, IAS 2010 - Houston, TX, United States
Duration: 3 Oct 20107 Oct 2010

Conference

Conference2010 IEEE Industry Applications Society Annual Meeting, IAS 2010
CountryUnited States
CityHouston, TX
Period3/10/107/10/10

Keywords

  • Harmonic current
  • Nuisance tripping
  • Residual current device
  • Surge and fault current

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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