Abstract
This paper presented an experimental investigation into operating characteristics of RCDs under an unbalanced current. The unbalanced current included the harmonic current, ground fault current, and surge current. A testing system was first set up in the laboratory, and the minimum value of the current causing RCD samples to trip were recorded. To obtain consistent testing results, RCD samples under test were demagnetized prior to each test. It is found that RCD tripping is primarily determined by the peak value of the unbalanced current. Under a ground fault RCDs installed in healthy circuits may trip. It would be necessary to limit the maximum leakage current in the circuits to avoid such nuisance tripping. Under surge conditions RCDs could withstand a large short-duration current. However, a long-duration surge current can easily cause RCDs to trip.
Original language | English |
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Title of host publication | 2010 IEEE Industry Applications Society Annual Meeting, IAS 2010 |
DOIs | |
Publication status | Published - 13 Dec 2010 |
Event | 2010 IEEE Industry Applications Society Annual Meeting, IAS 2010 - Houston, TX, United States Duration: 3 Oct 2010 → 7 Oct 2010 |
Conference
Conference | 2010 IEEE Industry Applications Society Annual Meeting, IAS 2010 |
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Country/Territory | United States |
City | Houston, TX |
Period | 3/10/10 → 7/10/10 |
Keywords
- Harmonic current
- Nuisance tripping
- Residual current device
- Surge and fault current
ASJC Scopus subject areas
- Control and Systems Engineering
- Industrial and Manufacturing Engineering
- Electrical and Electronic Engineering