Transient measurements of carrier relaxation time and density in the P3HT: PCBM organic photovoltaic cell

Camron Kouhestani; Duc D. Nguyen; Kenneth E. Kambour; Roderick A.B. Devine; Johnny Chen; Gang Li; Yang Yang

doi:10.1116/1.4918674

Transient measurements of carrier relaxation time and density in the P3HT: PCBM organic photovoltaic cell

Camron Kouhestani
, Duc D. Nguyen
, Kenneth E. Kambour
, Roderick A.B. Devine
, Johnny Chen
, Gang Li
, Yang Yang

Research output: Journal article publication › Journal article › Academic research › peer-review

3 Citations (Scopus)

Abstract

The authors have used transient photovoltage measurements to evaluate carrier relaxation times (τ) in P3HT:PCBM based photocells over a wide range of open circuit voltages. Satisfactory agreement is found with data obtained by low frequency impedance measurements. The authors find the differential capacitance measurements yield data consistent with the theoretical value expected based on Langevin recombination. The Langevin coefficient is three orders of magnitude smaller than the theoretical one. For the low light levels, the relaxation time variation is determined by the RC time constant behavior of the photodiode.

Original language	English
Article number	032404
Journal	Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics
Volume	33
Issue number	3
DOIs	https://doi.org/10.1116/1.4918674
Publication status	Published - 1 May 2015
Externally published	Yes

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 7 Affordable and Clean Energy

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Instrumentation
Process Chemistry and Technology
Surfaces, Coatings and Films
Electrical and Electronic Engineering
Materials Chemistry

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10.1116/1.4918674

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title = "Transient measurements of carrier relaxation time and density in the P3HT: PCBM organic photovoltaic cell",

abstract = "The authors have used transient photovoltage measurements to evaluate carrier relaxation times (τ) in P3HT:PCBM based photocells over a wide range of open circuit voltages. Satisfactory agreement is found with data obtained by low frequency impedance measurements. The authors find the differential capacitance measurements yield data consistent with the theoretical value expected based on Langevin recombination. The Langevin coefficient is three orders of magnitude smaller than the theoretical one. For the low light levels, the relaxation time variation is determined by the RC time constant behavior of the photodiode.",

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Transient measurements of carrier relaxation time and density in the P3HT: PCBM organic photovoltaic cell. / Kouhestani, Camron; Nguyen, Duc D.; Kambour, Kenneth E. et al.
In: Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, Vol. 33, No. 3, 032404, 01.05.2015.

Research output: Journal article publication › Journal article › Academic research › peer-review

TY - JOUR

T1 - Transient measurements of carrier relaxation time and density in the P3HT: PCBM organic photovoltaic cell

AU - Kouhestani, Camron

AU - Nguyen, Duc D.

AU - Kambour, Kenneth E.

AU - Devine, Roderick A.B.

AU - Chen, Johnny

AU - Li, Gang

AU - Yang, Yang

PY - 2015/5/1

Y1 - 2015/5/1

N2 - The authors have used transient photovoltage measurements to evaluate carrier relaxation times (τ) in P3HT:PCBM based photocells over a wide range of open circuit voltages. Satisfactory agreement is found with data obtained by low frequency impedance measurements. The authors find the differential capacitance measurements yield data consistent with the theoretical value expected based on Langevin recombination. The Langevin coefficient is three orders of magnitude smaller than the theoretical one. For the low light levels, the relaxation time variation is determined by the RC time constant behavior of the photodiode.

AB - The authors have used transient photovoltage measurements to evaluate carrier relaxation times (τ) in P3HT:PCBM based photocells over a wide range of open circuit voltages. Satisfactory agreement is found with data obtained by low frequency impedance measurements. The authors find the differential capacitance measurements yield data consistent with the theoretical value expected based on Langevin recombination. The Langevin coefficient is three orders of magnitude smaller than the theoretical one. For the low light levels, the relaxation time variation is determined by the RC time constant behavior of the photodiode.

UR - https://www.scopus.com/pages/publications/84928679386

U2 - 10.1116/1.4918674

DO - 10.1116/1.4918674

M3 - Journal article

SN - 2166-2746

VL - 33

JO - Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics

JF - Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics

IS - 3

M1 - 032404

ER -

Transient measurements of carrier relaxation time and density in the P3HT: PCBM organic photovoltaic cell

Abstract

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ASJC Scopus subject areas

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