Abstract
The authors have used transient photovoltage measurements to evaluate carrier relaxation times (τ) in P3HT:PCBM based photocells over a wide range of open circuit voltages. Satisfactory agreement is found with data obtained by low frequency impedance measurements. The authors find the differential capacitance measurements yield data consistent with the theoretical value expected based on Langevin recombination. The Langevin coefficient is three orders of magnitude smaller than the theoretical one. For the low light levels, the relaxation time variation is determined by the RC time constant behavior of the photodiode.
Original language | English |
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Article number | 032404 |
Journal | Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics |
Volume | 33 |
Issue number | 3 |
DOIs | |
Publication status | Published - 1 May 2015 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Instrumentation
- Process Chemistry and Technology
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering
- Materials Chemistry