Time-resolved photoluminescence study of the stimulated emission in ZnO nanoneedles

Wai Ming Kwok; A. B. Djurišić; Y. H. Leung; W. K. Chan; D. L. Phillips

doi:10.1063/1.2035871

Time-resolved photoluminescence study of the stimulated emission in ZnO nanoneedles

Wai Ming Kwok, A. B. Djurišić, Y. H. Leung, W. K. Chan, D. L. Phillips

Research output: Journal article publication › Journal article › Academic research › peer-review

92 Citations (Scopus)

Abstract

ZnO nanoneedles were fabricated by thermal evaporation of Zn nanoparticles at 800 °C and atmospheric pressure. The samples showed strong ultraviolet photoluminescence and weak orange defect luminescence. Time-resolved photoluminescence (TRPL) was measured using the Kerr-gated fluorescence technique in order to probe the ultrafast carrier dynamics in exciton-exciton scattering and electron hole plasma (EHP) regimes. In both regimes, the decay time of the photoluminescence is very fast (∼1 ps). Even though no structure is detected in the time-integrated spectra of the EHP emission, the TRPL reveals the coexistence of the excitons and free carriers. Possible reasons for the observed phenomena are discussed.

Original language	English
Article number	093108
Journal	Applied Physics Letters
Volume	87
Issue number	9
DOIs	https://doi.org/10.1063/1.2035871
Publication status	Published - 29 Aug 2005
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.2035871

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title = "Time-resolved photoluminescence study of the stimulated emission in ZnO nanoneedles",

abstract = "ZnO nanoneedles were fabricated by thermal evaporation of Zn nanoparticles at 800 °C and atmospheric pressure. The samples showed strong ultraviolet photoluminescence and weak orange defect luminescence. Time-resolved photoluminescence (TRPL) was measured using the Kerr-gated fluorescence technique in order to probe the ultrafast carrier dynamics in exciton-exciton scattering and electron hole plasma (EHP) regimes. In both regimes, the decay time of the photoluminescence is very fast (∼1 ps). Even though no structure is detected in the time-integrated spectra of the EHP emission, the TRPL reveals the coexistence of the excitons and free carriers. Possible reasons for the observed phenomena are discussed.",

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AU - Kwok, Wai Ming

AU - Djurišić, A. B.

AU - Leung, Y. H.

AU - Chan, W. K.

AU - Phillips, D. L.

PY - 2005/8/29

Y1 - 2005/8/29

N2 - ZnO nanoneedles were fabricated by thermal evaporation of Zn nanoparticles at 800 °C and atmospheric pressure. The samples showed strong ultraviolet photoluminescence and weak orange defect luminescence. Time-resolved photoluminescence (TRPL) was measured using the Kerr-gated fluorescence technique in order to probe the ultrafast carrier dynamics in exciton-exciton scattering and electron hole plasma (EHP) regimes. In both regimes, the decay time of the photoluminescence is very fast (∼1 ps). Even though no structure is detected in the time-integrated spectra of the EHP emission, the TRPL reveals the coexistence of the excitons and free carriers. Possible reasons for the observed phenomena are discussed.

AB - ZnO nanoneedles were fabricated by thermal evaporation of Zn nanoparticles at 800 °C and atmospheric pressure. The samples showed strong ultraviolet photoluminescence and weak orange defect luminescence. Time-resolved photoluminescence (TRPL) was measured using the Kerr-gated fluorescence technique in order to probe the ultrafast carrier dynamics in exciton-exciton scattering and electron hole plasma (EHP) regimes. In both regimes, the decay time of the photoluminescence is very fast (∼1 ps). Even though no structure is detected in the time-integrated spectra of the EHP emission, the TRPL reveals the coexistence of the excitons and free carriers. Possible reasons for the observed phenomena are discussed.

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M3 - Journal article

SN - 0003-6951

VL - 87

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 9

M1 - 093108

ER -

Time-resolved photoluminescence study of the stimulated emission in ZnO nanoneedles

Abstract

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