Thickness dependence of the structural properties of sol-gel derived Sr0.6Ba0.4Nb2O6films

Chee Leung Mak; C. H. Luk; K. H. Wong

doi:10.1016/S0040-6090(98)00488-X

Thickness dependence of the structural properties of sol-gel derived Sr_0.6Ba_0.4Nb₂O₆films

Chee Leung Mak, C. H. Luk, K. H. Wong

Research output: Journal article publication › Journal article › Academic research › peer-review

11 Citations (Scopus)

Abstract

Structural changes in sol-gel derived Sr0.6Ba0.4Nb2O6(SBN60) films on (001) Si substrates have been studied as a function of film thickness in the range of 0.65-2.3 μm. These films comprise a stack of dip-coated layers. Preferred and better oriented (001) SBN layers have been obtained in thicker films. Increased grain size and decreased porosity have also been observed. Prolonged annealing of the films, however, shows no apparent effects on these structural changes. In the present studies, we have fabricated SBN films of up to 2.3 μm thick with good mean crystallinity. Our results indicate that progressively improved sol-gel films can be produced by increasing the number of dip-coated layers.

Original language	English
Pages (from-to)	79-82
Number of pages	4
Journal	Thin Solid Films
Volume	325
Issue number	1-2
DOIs	https://doi.org/10.1016/S0040-6090(98)00488-X
Publication status	Published - 18 Jul 1998

Keywords

Sol-gel process
Strontium barium nitrobates
Structural properties

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

More information

10.1016/S0040-6090(98)00488-X

Cite this

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title = "Thickness dependence of the structural properties of sol-gel derived Sr0.6Ba0.4Nb2O6films",

abstract = "Structural changes in sol-gel derived Sr0.6Ba0.4Nb2O6(SBN60) films on (001) Si substrates have been studied as a function of film thickness in the range of 0.65-2.3 μm. These films comprise a stack of dip-coated layers. Preferred and better oriented (001) SBN layers have been obtained in thicker films. Increased grain size and decreased porosity have also been observed. Prolonged annealing of the films, however, shows no apparent effects on these structural changes. In the present studies, we have fabricated SBN films of up to 2.3 μm thick with good mean crystallinity. Our results indicate that progressively improved sol-gel films can be produced by increasing the number of dip-coated layers.",

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AU - Mak, Chee Leung

AU - Luk, C. H.

AU - Wong, K. H.

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Y1 - 1998/7/18

N2 - Structural changes in sol-gel derived Sr0.6Ba0.4Nb2O6(SBN60) films on (001) Si substrates have been studied as a function of film thickness in the range of 0.65-2.3 μm. These films comprise a stack of dip-coated layers. Preferred and better oriented (001) SBN layers have been obtained in thicker films. Increased grain size and decreased porosity have also been observed. Prolonged annealing of the films, however, shows no apparent effects on these structural changes. In the present studies, we have fabricated SBN films of up to 2.3 μm thick with good mean crystallinity. Our results indicate that progressively improved sol-gel films can be produced by increasing the number of dip-coated layers.

AB - Structural changes in sol-gel derived Sr0.6Ba0.4Nb2O6(SBN60) films on (001) Si substrates have been studied as a function of film thickness in the range of 0.65-2.3 μm. These films comprise a stack of dip-coated layers. Preferred and better oriented (001) SBN layers have been obtained in thicker films. Increased grain size and decreased porosity have also been observed. Prolonged annealing of the films, however, shows no apparent effects on these structural changes. In the present studies, we have fabricated SBN films of up to 2.3 μm thick with good mean crystallinity. Our results indicate that progressively improved sol-gel films can be produced by increasing the number of dip-coated layers.

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