Thermal annealing effect on electrical characteristics of CuPc thin-film transistors on glass with ZrO2as gate dielectric
- Wing Man Tang
- , M. G. Helander
- , J. Qiu
- , M. T. Greiner
- , Z. H. Lu
- , W. T. Ng
Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review
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