The optical constants of thin films calculated from reflectance and transmittance measurements

Donyau Chiang; Cheng Hung Chu; Hai Pang Chiang; Din Ping Tsai

doi:10.1109/ODS.2009.5031741

The optical constants of thin films calculated from reflectance and transmittance measurements

Donyau Chiang, Cheng Hung Chu, Hai Pang Chiang, Din Ping Tsai

Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

Abstract

The refraction index n and extinguished coefficient k of materials can be calculated from their reflection and transmittance measurements with varied wavelengths. The organic and inorganic materials used for optical recording medium materials are examined. The organic dyes show that significant optical constants vary with the laser wavelength, in comparison to the inorganic phase-change materials.

Original language	English
Title of host publication	2009 Optical Data Storage Topical Meeting, ODS 2009
Pages	101-103
Number of pages	3
DOIs	https://doi.org/10.1109/ODS.2009.5031741
Publication status	Published - May 2009
Externally published	Yes
Event	2009 Optical Data Storage Topical Meeting, ODS 2009 - Lake Buena Vista, FL, United States Duration: 10 May 2009 → 13 May 2009

Publication series

Name	2009 Optical Data Storage Topical Meeting, ODS 2009

Conference

Conference	2009 Optical Data Storage Topical Meeting, ODS 2009
Country/Territory	United States
City	Lake Buena Vista, FL
Period	10/05/09 → 13/05/09

ASJC Scopus subject areas

Hardware and Architecture

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10.1109/ODS.2009.5031741

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@inproceedings{eab800b41b7445bfa4bd2b94d2b66c29,

title = "The optical constants of thin films calculated from reflectance and transmittance measurements",

abstract = "The refraction index n and extinguished coefficient k of materials can be calculated from their reflection and transmittance measurements with varied wavelengths. The organic and inorganic materials used for optical recording medium materials are examined. The organic dyes show that significant optical constants vary with the laser wavelength, in comparison to the inorganic phase-change materials.",

author = "Donyau Chiang and Chu, {Cheng Hung} and Chiang, {Hai Pang} and Tsai, {Din Ping}",

year = "2009",

month = may,

doi = "10.1109/ODS.2009.5031741",

language = "English",

isbn = "9781424433438",

series = "2009 Optical Data Storage Topical Meeting, ODS 2009",

pages = "101--103",

booktitle = "2009 Optical Data Storage Topical Meeting, ODS 2009",

note = "2009 Optical Data Storage Topical Meeting, ODS 2009 ; Conference date: 10-05-2009 Through 13-05-2009",

}

Chiang, D, Chu, CH, Chiang, HP & Tsai, DP 2009, The optical constants of thin films calculated from reflectance and transmittance measurements. in 2009 Optical Data Storage Topical Meeting, ODS 2009., 5031741, 2009 Optical Data Storage Topical Meeting, ODS 2009, pp. 101-103, 2009 Optical Data Storage Topical Meeting, ODS 2009, Lake Buena Vista, FL, United States, 10/05/09. https://doi.org/10.1109/ODS.2009.5031741

The optical constants of thin films calculated from reflectance and transmittance measurements. / Chiang, Donyau; Chu, Cheng Hung; Chiang, Hai Pang et al.
2009 Optical Data Storage Topical Meeting, ODS 2009. 2009. p. 101-103 5031741 (2009 Optical Data Storage Topical Meeting, ODS 2009).

Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

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The optical constants of thin films calculated from reflectance and transmittance measurements

Abstract

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