The optical constants of thin films calculated from reflectance and transmittance measurements

Donyau Chiang, Cheng Hung Chu, Hai Pang Chiang, Din Ping Tsai

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

Abstract

The refraction index n and extinguished coefficient k of materials can be calculated from their reflection and transmittance measurements with varied wavelengths. The organic and inorganic materials used for optical recording medium materials are examined. The organic dyes show that significant optical constants vary with the laser wavelength, in comparison to the inorganic phase-change materials.

Original languageEnglish
Title of host publication2009 Optical Data Storage Topical Meeting, ODS 2009
Pages101-103
Number of pages3
DOIs
Publication statusPublished - May 2009
Externally publishedYes
Event2009 Optical Data Storage Topical Meeting, ODS 2009 - Lake Buena Vista, FL, United States
Duration: 10 May 200913 May 2009

Publication series

Name2009 Optical Data Storage Topical Meeting, ODS 2009

Conference

Conference2009 Optical Data Storage Topical Meeting, ODS 2009
Country/TerritoryUnited States
CityLake Buena Vista, FL
Period10/05/0913/05/09

ASJC Scopus subject areas

  • Hardware and Architecture

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