Abstract
Organic thin-film transistors based on a high mobility n-type semiconductor poly{[n,n9-bis(2-octyldodecyl)-naphthalene-1,4,5,8-bis(dicarboximide)-2,6-diyl] -alt-5,59-(2,29-bithiophene)} P(NDI2OD-T2) and different polymer gate dielectrics are fabricated. The average electron mobility decreases from 0.76 to 0.08 cm2/Vs with the increase of the gate dielectric constant from 2.6 to 7.8. The P(NDI2OD-T2) film shows unconventional face-on molecular packing, which results in short distances and pronounced interactions between electrons and gate dielectric. Therefore, the decrease of the electron mobility with the increasing dielectric constant is attributed to the Frhlich polaron effect for the interaction between electrons in the channel and ionic polarization cloud in the gate dielectric.
| Original language | English |
|---|---|
| Article number | 033301 |
| Journal | Applied Physics Letters |
| Volume | 100 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 16 Jan 2012 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
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