TY - JOUR
T1 - The influence of gate dielectrics on a high-mobility n-type conjugated polymer in organic thin-film transistors
AU - Li, Jinhua
AU - Du, Jun
AU - Xu, Jianbin
AU - Chan, Helen L.W.
AU - Yan, Feng
PY - 2012/1/16
Y1 - 2012/1/16
N2 - Organic thin-film transistors based on a high mobility n-type semiconductor poly{[n,n9-bis(2-octyldodecyl)-naphthalene-1,4,5,8-bis(dicarboximide)-2,6-diyl] -alt-5,59-(2,29-bithiophene)} P(NDI2OD-T2) and different polymer gate dielectrics are fabricated. The average electron mobility decreases from 0.76 to 0.08 cm2/Vs with the increase of the gate dielectric constant from 2.6 to 7.8. The P(NDI2OD-T2) film shows unconventional face-on molecular packing, which results in short distances and pronounced interactions between electrons and gate dielectric. Therefore, the decrease of the electron mobility with the increasing dielectric constant is attributed to the Frhlich polaron effect for the interaction between electrons in the channel and ionic polarization cloud in the gate dielectric.
AB - Organic thin-film transistors based on a high mobility n-type semiconductor poly{[n,n9-bis(2-octyldodecyl)-naphthalene-1,4,5,8-bis(dicarboximide)-2,6-diyl] -alt-5,59-(2,29-bithiophene)} P(NDI2OD-T2) and different polymer gate dielectrics are fabricated. The average electron mobility decreases from 0.76 to 0.08 cm2/Vs with the increase of the gate dielectric constant from 2.6 to 7.8. The P(NDI2OD-T2) film shows unconventional face-on molecular packing, which results in short distances and pronounced interactions between electrons and gate dielectric. Therefore, the decrease of the electron mobility with the increasing dielectric constant is attributed to the Frhlich polaron effect for the interaction between electrons in the channel and ionic polarization cloud in the gate dielectric.
UR - http://www.scopus.com/inward/record.url?scp=84863069736&partnerID=8YFLogxK
U2 - 10.1063/1.3678196
DO - 10.1063/1.3678196
M3 - Journal article
SN - 0003-6951
VL - 100
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 3
M1 - 033301
ER -