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The impact of trench geometry and processing on the performance and reliability of low voltage power UMOSFETs
S. A. Suliman, N. Gallogunta, L. Trabzon, Jianhua Hao, G. Dolny, R. Ridley, T. Grebs, J. Benjamin, C. Kocon, J. Zeng, C. M. Knoedler, M. Horn, O. O. Awadelkarim, S. J. Fonash, J. Ruzyllo
Research output: Journal article publication › Journal article › Academic research › peer-review
5
Citations
(Scopus)