Abstract
The grain size strongly influences the fatigue properties of Pb(Zr0.3Ti0.7)O3(PZT) thin films with platinum (Pt) electrodes. A film with smaller grain size has better fatigue properties. It was assumed that fatigue is mainly due to the pinning of domain walls by space charge or charged point defects near Pt electrodes. Therefore, the film with a lower fraction of the grains touching Pt electrodes has better fatigue properties. The permittivity of the thin film decreases with the decrease in grain size. This may be due to the decrease of mobility of domain walls with the decrease of grain size. All right reserved.
Original language | English |
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Pages (from-to) | 282-285 |
Number of pages | 4 |
Journal | Thin Solid Films |
Volume | 406 |
Issue number | 1-2 |
DOIs | |
Publication status | Published - 10 Mar 2002 |
Keywords
- Dielectric properties
- Domain wall
- Ferroelectric properties
- Interfaces
ASJC Scopus subject areas
- Surfaces, Coatings and Films
- Condensed Matter Physics
- Surfaces and Interfaces