The grain size effect of Pb(Zr0.3Ti0.7)O3thin films

Feng Yan, Peng Bao, Helen L W Chan, Chung Loong Choy, Yening Wang

Research output: Journal article publicationJournal articleAcademic researchpeer-review

45 Citations (Scopus)


The grain size strongly influences the fatigue properties of Pb(Zr0.3Ti0.7)O3(PZT) thin films with platinum (Pt) electrodes. A film with smaller grain size has better fatigue properties. It was assumed that fatigue is mainly due to the pinning of domain walls by space charge or charged point defects near Pt electrodes. Therefore, the film with a lower fraction of the grains touching Pt electrodes has better fatigue properties. The permittivity of the thin film decreases with the decrease in grain size. This may be due to the decrease of mobility of domain walls with the decrease of grain size. All right reserved.
Original languageEnglish
Pages (from-to)282-285
Number of pages4
JournalThin Solid Films
Issue number1-2
Publication statusPublished - 10 Mar 2002


  • Dielectric properties
  • Domain wall
  • Ferroelectric properties
  • Interfaces

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces


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