The grain size effect of Pb(Zr0.3Ti0.7)O3thin films

Feng Yan; Peng Bao; Helen L W Chan; Chung Loong Choy; Yening Wang

doi:10.1016/S0040-6090(01)01745-X

The grain size effect of Pb(Zr_0.3Ti_0.7)O₃thin films

Feng Yan, Peng Bao, Helen L W Chan, Chung Loong Choy, Yening Wang

Research output: Journal article publication › Journal article › Academic research › peer-review

45 Citations (Scopus)

Abstract

The grain size strongly influences the fatigue properties of Pb(Zr0.3Ti0.7)O3(PZT) thin films with platinum (Pt) electrodes. A film with smaller grain size has better fatigue properties. It was assumed that fatigue is mainly due to the pinning of domain walls by space charge or charged point defects near Pt electrodes. Therefore, the film with a lower fraction of the grains touching Pt electrodes has better fatigue properties. The permittivity of the thin film decreases with the decrease in grain size. This may be due to the decrease of mobility of domain walls with the decrease of grain size. All right reserved.

Original language	English
Pages (from-to)	282-285
Number of pages	4
Journal	Thin Solid Films
Volume	406
Issue number	1-2
DOIs	https://doi.org/10.1016/S0040-6090(01)01745-X
Publication status	Published - 10 Mar 2002

Keywords

Dielectric properties
Domain wall
Ferroelectric properties
Interfaces

ASJC Scopus subject areas

Surfaces, Coatings and Films
Condensed Matter Physics
Surfaces and Interfaces

More information

10.1016/S0040-6090(01)01745-X

Cite this

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title = "The grain size effect of Pb(Zr0.3Ti0.7)O3thin films",

abstract = "The grain size strongly influences the fatigue properties of Pb(Zr0.3Ti0.7)O3(PZT) thin films with platinum (Pt) electrodes. A film with smaller grain size has better fatigue properties. It was assumed that fatigue is mainly due to the pinning of domain walls by space charge or charged point defects near Pt electrodes. Therefore, the film with a lower fraction of the grains touching Pt electrodes has better fatigue properties. The permittivity of the thin film decreases with the decrease in grain size. This may be due to the decrease of mobility of domain walls with the decrease of grain size. All right reserved.",

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AU - Yan, Feng

AU - Bao, Peng

AU - Chan, Helen L W

AU - Choy, Chung Loong

AU - Wang, Yening

PY - 2002/3/10

Y1 - 2002/3/10

N2 - The grain size strongly influences the fatigue properties of Pb(Zr0.3Ti0.7)O3(PZT) thin films with platinum (Pt) electrodes. A film with smaller grain size has better fatigue properties. It was assumed that fatigue is mainly due to the pinning of domain walls by space charge or charged point defects near Pt electrodes. Therefore, the film with a lower fraction of the grains touching Pt electrodes has better fatigue properties. The permittivity of the thin film decreases with the decrease in grain size. This may be due to the decrease of mobility of domain walls with the decrease of grain size. All right reserved.

AB - The grain size strongly influences the fatigue properties of Pb(Zr0.3Ti0.7)O3(PZT) thin films with platinum (Pt) electrodes. A film with smaller grain size has better fatigue properties. It was assumed that fatigue is mainly due to the pinning of domain walls by space charge or charged point defects near Pt electrodes. Therefore, the film with a lower fraction of the grains touching Pt electrodes has better fatigue properties. The permittivity of the thin film decreases with the decrease in grain size. This may be due to the decrease of mobility of domain walls with the decrease of grain size. All right reserved.

KW - Dielectric properties

KW - Domain wall

KW - Ferroelectric properties

KW - Interfaces

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