Keyphrases
Surface Roughness
100%
Electronic Packaging
100%
Packaging Applications
100%
Polymer Substrate
100%
Plasma Etching Process
100%
Rigid-flex Substrate
100%
Plasma Treatment
50%
Taguchi Method
50%
Scanning Electron Microscopy
50%
Chemical Changes
50%
Process Cycles
50%
Atomic Force Microscopy
50%
Printed Circuit Board
50%
Interfacial Properties
50%
High Reliability
50%
Optimum Parameters
50%
Parameter Setting
50%
Orthogonal Array
50%
Physical Changes
50%
Parameter Configuration
50%
Parameter Analysis
50%
High Reproducibility
50%
Taguchi Experiment
50%
High-speed Transmission
50%
Plasma Etching
50%
Rigid-flexible
50%
Plasma-induced
50%
Electrical Reliability
50%
Maximum Information
50%
Mechanical Reliability
50%
Device Miniaturization
50%
Traditional Uses
50%
Optimal Process Conditions
50%
Cycle Condition
50%
Transmission Circuit
50%
Device Packaging
50%
Electronic Packaging Technology
50%
Reliability Properties
50%
Engineering
Etching Process
100%
Polymer Substrate
100%
Electronic Packaging
100%
Hydrophobic
50%
Subsurface
50%
Plasma Treatment
50%
Printed Circuit Board
50%
Induced Change
50%
Taguchi Method
50%
Experimental Run
50%
Optimal Process Condition
50%
Trigger Circuit
50%
Atomic Force Microscopy
50%
Material Science
Surface Roughness
100%
Plasma Etching
100%
Electronic Circuit
100%
Taguchi Method
50%
Scanning Electron Microscopy
50%
Interface Property
50%
Surface (Surface Science)
50%