Tapping-mode tuning-fork near-field scanning optical microscopy of low power semiconductor lasers

N.H. Lu, W.C. Lin, Din-ping Tsai

Research output: Journal article publicationJournal articleAcademic researchpeer-review

4 Citations (Scopus)

Abstract

The newly developed inverted tapping-mode tuning-fork near-field scanning optical microscopy (TMTF-NSOM) is used to study the local near-field optical properties of strained AlGaInP/Ga0.4In0.6P low power visible multiquantum-well laser diodes. In contrast to shear-force mode NSOM, TMTF-NSOM provides the function to acquire the evanescent wave intensity ratio |I(2?)|/|I(?)| image, from which the evanescent wave decay coefficient q can be evaluated for a known tapping amplitude. Moreover, we probe the near-field stimulated emission spectrum, which gives the free-space laser light wavelength ?O and the index of refraction nr of the laser diode resonant cavity. Once q, ?O, and nr are all measured, we can determine the angle of incidence ?O of the dominant totally internally reflected waves incident on the front mirror facet of the resonator. Determination of such an angle is very important in modelling the stability of the laser diode resonator.
Original languageEnglish
Pages (from-to)172-175
Number of pages4
JournalJournal of Microscopy
Volume202
Issue number1
DOIs
Publication statusPublished - 5 May 2001
Externally publishedYes

Keywords

  • Evanescent waves
  • Near-field scanning optical microscopy
  • Semiconductor laser
  • Tapping-mode

ASJC Scopus subject areas

  • Pathology and Forensic Medicine
  • Histology

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