TY - GEN
T1 - Surviving Transient Power Failures with SRAM Data Retention
AU - Liu, Songran
AU - Zhang, Wei
AU - Lv, Mingsong
AU - Chen, Qiulin
AU - Guan, Nan
N1 - Funding Information:
This work was supported by Huawei Innovation Research Program “Collaborative Research Project on Computational Sensing”, the Research Grants Council of Hong Kong (GRF 15204917 and 15213818), and Natural Science Foundation of China (grant No. 61772123 and 61672140). *Corresponding author: Mingsong Lv. Email: [email protected]
Publisher Copyright:
© 2021 EDAA.
PY - 2021/2/1
Y1 - 2021/2/1
N2 - Many computing systems, such as those powered by energy harvesting or deployed in harsh working environment, may experience unpredictable and frequent transient power failures in their life time. The systems may fail to deliver correct computation results or never progress, as computation is frequently interrupted by the power failures. A possible solution could be frequently saving program states to non-volatile memory (NVM), such as using checkpoints, so that the system can incrementally progress. However, this approach is too costly, since frequent NVM writes is time and energy consuming, and may wear out the NVM device. In this work, we propose an approach to enable a system to use volatile SRAM to correctly progress in the presence of transient power failures, since SRAM is capable of retaining its data for seconds or minutes with the charge remained in the battery/capacitor after the CPU core stops at its brown-out voltage. The main problem is to validate whether the data in SRAM are actually retained during power failures. In our approach, we validate only a subset of the program states with Cyclic Redundancy Check for efficiency. The validation technique requires maintaining a backup version of the program states, which additionally provides the system with the ability to progress incrementally. We implement a run-time system with the proposed approach. Experimental results on an MSP430 platform show that the system can correctly progress on SRAM in the presence of transient power failures with low overhead.
AB - Many computing systems, such as those powered by energy harvesting or deployed in harsh working environment, may experience unpredictable and frequent transient power failures in their life time. The systems may fail to deliver correct computation results or never progress, as computation is frequently interrupted by the power failures. A possible solution could be frequently saving program states to non-volatile memory (NVM), such as using checkpoints, so that the system can incrementally progress. However, this approach is too costly, since frequent NVM writes is time and energy consuming, and may wear out the NVM device. In this work, we propose an approach to enable a system to use volatile SRAM to correctly progress in the presence of transient power failures, since SRAM is capable of retaining its data for seconds or minutes with the charge remained in the battery/capacitor after the CPU core stops at its brown-out voltage. The main problem is to validate whether the data in SRAM are actually retained during power failures. In our approach, we validate only a subset of the program states with Cyclic Redundancy Check for efficiency. The validation technique requires maintaining a backup version of the program states, which additionally provides the system with the ability to progress incrementally. We implement a run-time system with the proposed approach. Experimental results on an MSP430 platform show that the system can correctly progress on SRAM in the presence of transient power failures with low overhead.
KW - SRAM data retention
KW - transient power failure
UR - http://www.scopus.com/inward/record.url?scp=85111063513&partnerID=8YFLogxK
U2 - 10.23919/DATE51398.2021.9474038
DO - 10.23919/DATE51398.2021.9474038
M3 - Conference article published in proceeding or book
AN - SCOPUS:85111063513
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 868
EP - 873
BT - Proceedings of the 2021 Design, Automation and Test in Europe, DATE 2021
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2021 Design, Automation and Test in Europe Conference and Exhibition, DATE 2021
Y2 - 1 February 2021 through 5 February 2021
ER -