Surface plasmon resonance monitoring of temperature via phase measurement

H.-P. Chiang, H.-T. Yeh, C.-M. Chen, J.-C. Wu, S.-Y. Su, R. Chang, Y.-J. Wu, Din-ping Tsai, S.U. Jen, P.T. Leung

Research output: Journal article publicationJournal articleAcademic researchpeer-review

65 Citations (Scopus)

Abstract

The application of surface plasmon resonance to the monitoring of the temperature of a metal film and its environment is well-established. A new feature in our present experimental work is to carry out this monitoring via the measurement of the phase difference between a s and a p-polarized wave at different wavelengths, 632.8 nm and 1.15 ?m, based on a technique established previously in the literature. By monitoring the change of this phase as a function of the film temperature, it is found that this approach leads to very sensitive measurements of temperature, in comparison with previous approaches in which reflectance was measured instead. Sensitivity is 0.027 K at incident wavelength of 632.8 nm and 0.1 K at incident wavelength of 1.15 ?m. A simple model based on the temperature dependence of the optical constants of the metal is applied to simulate our measurements, and it is found that the general qualitative behavior and trend of the experimental results can be reasonably accounted for using such a model. © 2004 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)409-418
Number of pages10
JournalOptics Communications
Volume241
Issue number4-6
DOIs
Publication statusPublished - 16 Nov 2004
Externally publishedYes

Keywords

  • Phase measurement
  • Surface plasmon resonance
  • Temperature effects

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

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