Subwavelength resolution from multilayered structure (Conference Presentation)

Bo Han Cheng, Yi Jun Jen, Wei Chih Liu, Shan Wen Lin, Yung Chiang Lan, Din Ping Tsai

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

Abstract

Breaking optical diffraction limit is one of the most important issues needed to be overcome for the demand of high-density optoelectronic components. Here, a multilayered structure which consists of alternating semiconductor and dielectric layers for breaking optical diffraction limitation at THz frequency region are proposed and analyzed. We numerically demonstrate that such multilayered structure not only can act as a hyperbolic metamaterial but also a birefringence material via the control of the external temperature (or magnetic field). A practical approach is provided to control all the diffraction signals toward a specific direction by using transfer matrix method and effective medium theory. Numerical calculations and computer simulation (based on finite element method, FEM) are carried out, which agree well with each other. The temperature (or magnetic field) parameter can be tuned to create an effective material with nearly flat isofrequency feature to transfer (project) all the k-space signals excited from the object to be resolved to the image plane. Furthermore, this multilayered structure can resolve subwavelength structures at various incident THz light sources simultaneously. In addition, the resolution power for a fixed operating frequency also can be tuned by only changing the magnitude of external magnetic field. Such a device provides a practical route for multi-functional material, photolithography and real-time super-resolution image.

Original languageEnglish
Title of host publicationNanostructured Thin Films IX
EditorsTom G. Mackay, Akhlesh Lakhtakia, Motofumi Suzuki
PublisherSPIE
ISBN (Electronic)9781510602496
DOIs
Publication statusPublished - Aug 2016
Externally publishedYes
EventNanostructured Thin Films IX - San Diego, United States
Duration: 30 Aug 20161 Sept 2016

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9929
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceNanostructured Thin Films IX
Country/TerritoryUnited States
CitySan Diego
Period30/08/161/09/16

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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