Sub-100 nm resolution microscopy based on proximity projection grating scheme

Feng Hu; Michael Geoffrey Somekh; Darren J. Albutt; Kevin Webb; Emilia Moradi; Chung W. See

doi:10.1038/srep08589

Sub-100 nm resolution microscopy based on proximity projection grating scheme

Feng Hu, Michael Geoffrey Somekh, Darren J. Albutt, Kevin Webb, Emilia Moradi, Chung W. See

Research output: Journal article publication › Journal article › Academic research › peer-review

10 Citations (Scopus)

Abstract

Structured illumination microscopy (SIM) has been widely used in life science imaging applications. The maximum resolution improvement of SIM, compared to conventional bright field system is a factor of 2. Here we present an approach to structured illumination microscopy using the proximity projection grating scheme (PPGS), which has the ability to further enhance the SIM resolution without invoking any nonlinearity response from the sample. With the PPGS-based SIM, sub-100 nm resolution has been obtained experimentally, and results corresponding to 2.4 times resolution improvement are presented. Furthermore, it will be shown that an improvement of greater than 3 times can be achieved.

Original language	English
Article number	8589
Journal	Scientific Reports
Volume	5
DOIs	https://doi.org/10.1038/srep08589
Publication status	Published - 1 Jan 2015
Externally published	Yes

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10.1038/srep08589

http://hdl.handle.net/10397/60931

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abstract = "Structured illumination microscopy (SIM) has been widely used in life science imaging applications. The maximum resolution improvement of SIM, compared to conventional bright field system is a factor of 2. Here we present an approach to structured illumination microscopy using the proximity projection grating scheme (PPGS), which has the ability to further enhance the SIM resolution without invoking any nonlinearity response from the sample. With the PPGS-based SIM, sub-100 nm resolution has been obtained experimentally, and results corresponding to 2.4 times resolution improvement are presented. Furthermore, it will be shown that an improvement of greater than 3 times can be achieved.",

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T1 - Sub-100 nm resolution microscopy based on proximity projection grating scheme

AU - Hu, Feng

AU - Somekh, Michael Geoffrey

AU - Albutt, Darren J.

AU - Webb, Kevin

AU - Moradi, Emilia

AU - See, Chung W.

PY - 2015/1/1

Y1 - 2015/1/1

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AB - Structured illumination microscopy (SIM) has been widely used in life science imaging applications. The maximum resolution improvement of SIM, compared to conventional bright field system is a factor of 2. Here we present an approach to structured illumination microscopy using the proximity projection grating scheme (PPGS), which has the ability to further enhance the SIM resolution without invoking any nonlinearity response from the sample. With the PPGS-based SIM, sub-100 nm resolution has been obtained experimentally, and results corresponding to 2.4 times resolution improvement are presented. Furthermore, it will be shown that an improvement of greater than 3 times can be achieved.

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ER -

Sub-100 nm resolution microscopy based on proximity projection grating scheme

Abstract

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