Sub-100 nm resolution microscopy based on proximity projection grating scheme

Feng Hu, Michael Geoffrey Somekh, Darren J. Albutt, Kevin Webb, Emilia Moradi, Chung W. See

Research output: Journal article publicationJournal articleAcademic researchpeer-review

8 Citations (Scopus)

Abstract

Structured illumination microscopy (SIM) has been widely used in life science imaging applications. The maximum resolution improvement of SIM, compared to conventional bright field system is a factor of 2. Here we present an approach to structured illumination microscopy using the proximity projection grating scheme (PPGS), which has the ability to further enhance the SIM resolution without invoking any nonlinearity response from the sample. With the PPGS-based SIM, sub-100 nm resolution has been obtained experimentally, and results corresponding to 2.4 times resolution improvement are presented. Furthermore, it will be shown that an improvement of greater than 3 times can be achieved.
Original languageEnglish
Article number8589
JournalScientific Reports
Volume5
DOIs
Publication statusPublished - 1 Jan 2015
Externally publishedYes

ASJC Scopus subject areas

  • General

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