Keyphrases
Failure Mode
100%
Electroplating Process
100%
Solder Bump
100%
Eutectic Solder
100%
Fabrication Methods
40%
Current Density
40%
Shear Test
40%
Surface Roughness
20%
Electroplating
20%
Activation Energy
20%
Intermetallic Compound Formation
20%
Shear Strength
20%
Shear Mode
20%
Solder Joint
20%
Cu Microstructure
20%
Thermal Aging Test
20%
Stud
20%
Growth Kinetics
20%
Cu3Sn
20%
Plating Process
20%
Bump
20%
Cu-Sn
20%
Cu Surface
20%
Flip-chip Process
20%
Solder Bumping
20%
Test Failure
20%
Cu Plating
20%
IMC Layer Thickness
20%
Engineering
Solder Bump
100%
Failure Mode
100%
Eutectics
100%
Growth Kinetics
20%
Layer Thickness
20%
Compound Formation
20%
Plating Process
20%
Cu Surface
20%
Chip Process
20%
Joints (Structural Components)
20%
Activation Energy
20%
Shear Strength
20%
Intermetallics
20%
Material Science
Electroplating
100%
Shear Testing
50%
Plating
50%
Density
50%
Surface Roughness
25%
Thermal Aging
25%
Solder Joint
25%
Shear Strength
25%
Activation Energy
25%
Intermetallics
25%