Study of the optical response of phase-change recording layer with zinc oxide nanostructured thin film

T.S. Kao, Y.H. Fu, H.W. Hsu, Din-ping Tsai

Research output: Journal article publicationJournal articleAcademic researchpeer-review

9 Citations (Scopus)


Recently, use of nanostructured materials as a near-field optical active layer has attracted a lot of interest. The non-linear optical properties and strong enhancements of metallic oxide nanostructured thin films are key functions in applications of promising nanophotonics. For the importance of ultra-high density optical data storage, we continue investigating the ultra-high density recording property of near-field optical disk consisting of zinc oxide (ZnOx) nanostructured thin film. A carrier-to-noise ratio above 38 dB at a recording mark size of 100 nm can be obtained in the ZnO x near-field optical disk by a DVD driver tester directly. In this article, we use an optical pump-probe system (static media tester) to measure the optical response of a phase-change recording layer (Ge2Sb 2Te5) and demonstrate the high contrast of optical recording with a ZnOx nanostructured thin film in short pulse durations. Also, we investigate the dependence of writing power and the optical response in conventional re-writable recording layers and the phase-change material with ZnOx nanostructured thin film. © 2008 The Authors.
Original languageEnglish
Pages (from-to)561-566
Number of pages6
JournalJournal of Microscopy
Issue number3
Publication statusPublished - 1 Mar 2008
Externally publishedYes


  • Near-field optical disk
  • Phase-change recording material
  • Ultra-high density recording
  • ZnOx nanostructured thin film

ASJC Scopus subject areas

  • Pathology and Forensic Medicine
  • Histology


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