Study of optical fibre structures by Atomic Force Microscopy

Din-ping Tsai, Y.L. Chung

Research output: Journal article publicationJournal articleAcademic researchpeer-review

3 Citations (Scopus)


A novel method using atomic force microscopy (AFM) to study optical fibre structures at the fibre end-face has been successfully developed. The doping concentration profiles of fibres revealed by differential etching speeds in a saturated solution of ammonium bifluoride at room temperature (25°C) were obtained from AFM topographic images. The superior spatial resolution of AFM made it possible to resolve concentric structures a hundred times smaller than the feature, due to the difference in the known refractive index (?n) of 1 × 10-3. Fibres with small core diameters and anisotropic structures, such as polarization-maintaining fibres, were studied with ease. © 1996 Chapman & Hall.
Original languageEnglish
Pages (from-to)1563-1570
Number of pages8
JournalOptical and Quantum Electronics
Issue number10
Publication statusPublished - 1 Jan 1996
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering


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