Study of optical fibre structures by Atomic Force Microscopy

Din-ping Tsai; Y.L. Chung

doi:10.1007/BF00326226

Study of optical fibre structures by Atomic Force Microscopy

Din-ping Tsai, Y.L. Chung

Research output: Journal article publication › Journal article › Academic research › peer-review

3 Citations (Scopus)

Abstract

A novel method using atomic force microscopy (AFM) to study optical fibre structures at the fibre end-face has been successfully developed. The doping concentration profiles of fibres revealed by differential etching speeds in a saturated solution of ammonium bifluoride at room temperature (25°C) were obtained from AFM topographic images. The superior spatial resolution of AFM made it possible to resolve concentric structures a hundred times smaller than the feature, due to the difference in the known refractive index (?n) of 1 × 10-3. Fibres with small core diameters and anisotropic structures, such as polarization-maintaining fibres, were studied with ease. © 1996 Chapman & Hall.

Original language	English
Pages (from-to)	1563-1570
Number of pages	8
Journal	Optical and Quantum Electronics
Volume	28
Issue number	10
DOIs	https://doi.org/10.1007/BF00326226
Publication status	Published - 1 Jan 1996
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

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10.1007/BF00326226

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Study of optical fibre structures by Atomic Force Microscopy

Abstract

ASJC Scopus subject areas

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