Study of optical fiber structures using atomic force microscopy and scanning near-field optical microscopy

Din Ping Tsai, Yueh L. Chung, Andreas Othonos

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

1 Citation (Scopus)

Abstract

Atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM) were used to study optical fiber structures. The refractive index profile of fiber was disclosed by surface topography of etched fiber endface using a AFM. The difference of refractive index was resolved to 1 × 10 -6. Near-field optical intensity distribution at fiber endface has been successfully measured by a tapping-mode force regulated SNOM. Combination of tapping-mode AFM and SNOM allowed us to image both refractive index and near-field intensity structures of fibers simultaneously. The correlation between waveguide structures and near-field propagating modes was directly provided by this novel method. Results of single mode fibers and fibers with anisotropic structures illustrated the usefulness of this technique.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsS.Iraj Najafi, Mario N. Armenise
Pages204-210
Number of pages7
Publication statusPublished - 30 Jan 1996
Externally publishedYes
EventFunctional Photonic and Fiber Devices - San Jose, CA, USA
Duration: 30 Jan 19961 Feb 1996

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2695
ISSN (Print)0277-786X

Conference

ConferenceFunctional Photonic and Fiber Devices
CitySan Jose, CA, USA
Period30/01/961/02/96

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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