Study of optical fiber structures using atomic force microscopy and scanning near-field optical microscopy

Din Ping Tsai; Yueh L. Chung; Andreas Othonos

Study of optical fiber structures using atomic force microscopy and scanning near-field optical microscopy

Din Ping Tsai, Yueh L. Chung, Andreas Othonos

Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

1 Citation (Scopus)

Abstract

Atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM) were used to study optical fiber structures. The refractive index profile of fiber was disclosed by surface topography of etched fiber endface using a AFM. The difference of refractive index was resolved to 1 × 10 ^-6. Near-field optical intensity distribution at fiber endface has been successfully measured by a tapping-mode force regulated SNOM. Combination of tapping-mode AFM and SNOM allowed us to image both refractive index and near-field intensity structures of fibers simultaneously. The correlation between waveguide structures and near-field propagating modes was directly provided by this novel method. Results of single mode fibers and fibers with anisotropic structures illustrated the usefulness of this technique.

Original language	English
Title of host publication	Proceedings of SPIE - The International Society for Optical Engineering
Editors	S.Iraj Najafi, Mario N. Armenise
Pages	204-210
Number of pages	7
Publication status	Published - 30 Jan 1996
Externally published	Yes
Event	Functional Photonic and Fiber Devices - San Jose, CA, USA Duration: 30 Jan 1996 → 1 Feb 1996

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	2695
ISSN (Print)	0277-786X

Conference

Conference	Functional Photonic and Fiber Devices
City	San Jose, CA, USA
Period	30/01/96 → 1/02/96

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Cite this

Tsai, D. P., Chung, Y. L., & Othonos, A. (1996). Study of optical fiber structures using atomic force microscopy and scanning near-field optical microscopy. In S. I. Najafi, & M. N. Armenise (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (pp. 204-210). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2695).

Tsai, Din Ping ; Chung, Yueh L. ; Othonos, Andreas. / Study of optical fiber structures using atomic force microscopy and scanning near-field optical microscopy. Proceedings of SPIE - The International Society for Optical Engineering. editor / S.Iraj Najafi ; Mario N. Armenise. 1996. pp. 204-210 (Proceedings of SPIE - The International Society for Optical Engineering).

@inproceedings{8c0f9886462b41df9d70db757bb4319d,

title = "Study of optical fiber structures using atomic force microscopy and scanning near-field optical microscopy",

abstract = "Atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM) were used to study optical fiber structures. The refractive index profile of fiber was disclosed by surface topography of etched fiber endface using a AFM. The difference of refractive index was resolved to 1 × 10 -6. Near-field optical intensity distribution at fiber endface has been successfully measured by a tapping-mode force regulated SNOM. Combination of tapping-mode AFM and SNOM allowed us to image both refractive index and near-field intensity structures of fibers simultaneously. The correlation between waveguide structures and near-field propagating modes was directly provided by this novel method. Results of single mode fibers and fibers with anisotropic structures illustrated the usefulness of this technique.",

author = "Tsai, {Din Ping} and Chung, {Yueh L.} and Andreas Othonos",

year = "1996",

month = jan,

day = "30",

language = "English",

isbn = "0819420697",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

pages = "204--210",

editor = "S.Iraj Najafi and Armenise, {Mario N.}",

booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",

note = "Functional Photonic and Fiber Devices ; Conference date: 30-01-1996 Through 01-02-1996",

}

Tsai, DP, Chung, YL & Othonos, A 1996, Study of optical fiber structures using atomic force microscopy and scanning near-field optical microscopy. in SI Najafi & MN Armenise (eds), Proceedings of SPIE - The International Society for Optical Engineering. Proceedings of SPIE - The International Society for Optical Engineering, vol. 2695, pp. 204-210, Functional Photonic and Fiber Devices, San Jose, CA, USA, 30/01/96.

Study of optical fiber structures using atomic force microscopy and scanning near-field optical microscopy. / Tsai, Din Ping; Chung, Yueh L.; Othonos, Andreas.
Proceedings of SPIE - The International Society for Optical Engineering. ed. / S.Iraj Najafi; Mario N. Armenise. 1996. p. 204-210 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2695).

Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

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AU - Tsai, Din Ping

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AU - Othonos, Andreas

PY - 1996/1/30

Y1 - 1996/1/30

N2 - Atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM) were used to study optical fiber structures. The refractive index profile of fiber was disclosed by surface topography of etched fiber endface using a AFM. The difference of refractive index was resolved to 1 × 10 -6. Near-field optical intensity distribution at fiber endface has been successfully measured by a tapping-mode force regulated SNOM. Combination of tapping-mode AFM and SNOM allowed us to image both refractive index and near-field intensity structures of fibers simultaneously. The correlation between waveguide structures and near-field propagating modes was directly provided by this novel method. Results of single mode fibers and fibers with anisotropic structures illustrated the usefulness of this technique.

AB - Atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM) were used to study optical fiber structures. The refractive index profile of fiber was disclosed by surface topography of etched fiber endface using a AFM. The difference of refractive index was resolved to 1 × 10 -6. Near-field optical intensity distribution at fiber endface has been successfully measured by a tapping-mode force regulated SNOM. Combination of tapping-mode AFM and SNOM allowed us to image both refractive index and near-field intensity structures of fibers simultaneously. The correlation between waveguide structures and near-field propagating modes was directly provided by this novel method. Results of single mode fibers and fibers with anisotropic structures illustrated the usefulness of this technique.

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M3 - Conference article published in proceeding or book

AN - SCOPUS:0029763636

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SN - 9780819420695

T3 - Proceedings of SPIE - The International Society for Optical Engineering

SP - 204

EP - 210

BT - Proceedings of SPIE - The International Society for Optical Engineering

A2 - Najafi, S.Iraj

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T2 - Functional Photonic and Fiber Devices

Y2 - 30 January 1996 through 1 February 1996

ER -

Study of optical fiber structures using atomic force microscopy and scanning near-field optical microscopy

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