Abstract
A novel method using a tapping-mode scanning near-field optical microscopy (SNOM) and atomic force microscopy (AFM) to study both optical fiber structures and near-field optical intensity profiles at fiber endface was developed. This technique, as demonstrated, probed both refractive index distribution and near-field propagating intensity profile of fiber structures simultaneously. Correlation between waveguide structures and near-field propagating modes was acquired directly from experimental images.
| Original language | English |
|---|---|
| Pages | 115-116 |
| Number of pages | 2 |
| Publication status | Published - 18 Nov 1996 |
| Externally published | Yes |
| Event | Proceedings of the 1996 9th Annual Meeting of IEEE Lasers and Electro-Optics Society, LEOS'96. Part 1 (of 2) - Boston, MA, USA Duration: 18 Nov 1996 → 19 Nov 1996 |
Conference
| Conference | Proceedings of the 1996 9th Annual Meeting of IEEE Lasers and Electro-Optics Society, LEOS'96. Part 1 (of 2) |
|---|---|
| City | Boston, MA, USA |
| Period | 18/11/96 → 19/11/96 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
Fingerprint
Dive into the research topics of 'Study of near-field propagating mode profiles and waveguide structures of optical fibers'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver