Abstract
A novel method using a tapping-mode scanning near-field optical microscopy (SNOM) and atomic force microscopy (AFM) to study both optical fiber structures and near-field optical intensity profiles at fiber endface was developed. This technique, as demonstrated, probed both refractive index distribution and near-field propagating intensity profile of fiber structures simultaneously. Correlation between waveguide structures and near-field propagating modes was acquired directly from experimental images.
Original language | English |
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Pages | 115-116 |
Number of pages | 2 |
Publication status | Published - 18 Nov 1996 |
Externally published | Yes |
Event | Proceedings of the 1996 9th Annual Meeting of IEEE Lasers and Electro-Optics Society, LEOS'96. Part 1 (of 2) - Boston, MA, USA Duration: 18 Nov 1996 → 19 Nov 1996 |
Conference
Conference | Proceedings of the 1996 9th Annual Meeting of IEEE Lasers and Electro-Optics Society, LEOS'96. Part 1 (of 2) |
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City | Boston, MA, USA |
Period | 18/11/96 → 19/11/96 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering