Study of near-field aperture property of a nanometer AgOx thin film

Fu Han Ho, Hsun Hao Chang, Yu Hsaun Lin, Din Ping Tsai

Research output: Journal article publicationConference articleAcademic researchpeer-review

1 Citation (Scopus)

Abstract

AgOx thin-films were studied by using an optical read-write-tester. Two different states were found by CCD and SEM images, and the optical properties were examined by the pump-probe technique. A scattering center was found in the AgOx thin film. The enhanced reflectance was due to strongly local scattering and plasmon excitations.

Original languageEnglish
Pages (from-to)39-44
Number of pages6
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4930
DOIs
Publication statusPublished - Oct 2002
Externally publishedYes
EventAdvanced Optical Storage Technology 2002 - Shanghai, China
Duration: 14 Oct 200218 Oct 2002

Keywords

  • AgOx film
  • Near-field optics
  • Optical read-write tester
  • Plasmon
  • Pump-probe techniques

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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