Study of near-field aperture property of a nanometer AgOx thin film

Fu Han Ho; Hsun Hao Chang; Yu Hsaun Lin; Din Ping Tsai

doi:10.1117/12.483309

Study of near-field aperture property of a nanometer AgO_x thin film

Fu Han Ho, Hsun Hao Chang, Yu Hsaun Lin, Din Ping Tsai

Research output: Journal article publication › Conference article › Academic research › peer-review

1 Citation (Scopus)

Abstract

AgOx thin-films were studied by using an optical read-write-tester. Two different states were found by CCD and SEM images, and the optical properties were examined by the pump-probe technique. A scattering center was found in the AgOx thin film. The enhanced reflectance was due to strongly local scattering and plasmon excitations.

Original language	English
Pages (from-to)	39-44
Number of pages	6
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	4930
DOIs	https://doi.org/10.1117/12.483309
Publication status	Published - Oct 2002
Externally published	Yes
Event	Advanced Optical Storage Technology 2002 - Shanghai, China Duration: 14 Oct 2002 → 18 Oct 2002

Keywords

AgOx film
Near-field optics
Optical read-write tester
Plasmon
Pump-probe techniques

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

More information

10.1117/12.483309

Cite this

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abstract = "AgOx thin-films were studied by using an optical read-write-tester. Two different states were found by CCD and SEM images, and the optical properties were examined by the pump-probe technique. A scattering center was found in the AgOx thin film. The enhanced reflectance was due to strongly local scattering and plasmon excitations.",

keywords = "AgOx film, Near-field optics, Optical read-write tester, Plasmon, Pump-probe techniques",

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AU - Tsai, Din Ping

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KW - AgOx film

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KW - Optical read-write tester

KW - Plasmon

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