Study of nanoscale recorded marks on phase-change recording layers and the interactions with surroundings

S.K. Lin; I.C. Lin; S.Y. Chen; H.W. Hsu; Din-ping Tsai

doi:10.1109/TMAG.2006.888471

Study of nanoscale recorded marks on phase-change recording layers and the interactions with surroundings

S.K. Lin, I.C. Lin, S.Y. Chen, H.W. Hsu, Din-ping Tsai

Research output: Journal article publication › Journal article › Academic research › peer-review

13 Citations (Scopus)

Abstract

Conductive-atomic force microscopy (C-AFM) has been used for studying nanoscale recorded marks with different length on the phase-change recording layer of optical disks. Through C-AFM images, a comparison of nanoscale recorded marks on phase-change recording layer under different writing strategies and writing power has been taken. The comparison can help analyze the combination of writing strategy, writing power and laser pulse width. The various lengths of recorded marks for high density data storage have also been found out. The interactions between phase-change recording layers and their surroundings have also been studied. This study opens up a possibility to improve the capacity of data storage in today's commercial optical disks. © 2007 IEEE.

Original language	English
Pages (from-to)	861-863
Number of pages	3
Journal	IEEE Transactions on Magnetics
Volume	43
Issue number	2
DOIs	https://doi.org/10.1109/TMAG.2006.888471
Publication status	Published - 1 Feb 2007
Externally published	Yes

Keywords

Conductive-atomic force microscopy (C-AFM)
DVD
Optical disk
Phase-change recording layer
Recorded mark
Writing strategy

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

More information

10.1109/TMAG.2006.888471

Cite this

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abstract = "Conductive-atomic force microscopy (C-AFM) has been used for studying nanoscale recorded marks with different length on the phase-change recording layer of optical disks. Through C-AFM images, a comparison of nanoscale recorded marks on phase-change recording layer under different writing strategies and writing power has been taken. The comparison can help analyze the combination of writing strategy, writing power and laser pulse width. The various lengths of recorded marks for high density data storage have also been found out. The interactions between phase-change recording layers and their surroundings have also been studied. This study opens up a possibility to improve the capacity of data storage in today's commercial optical disks. {\textcopyright} 2007 IEEE.",

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AU - Tsai, Din-ping

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Study of nanoscale recorded marks on phase-change recording layers and the interactions with surroundings

Abstract

Keywords

ASJC Scopus subject areas

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