Study of compositionally graded epitaxial barium strontium titanate thin films derived from pulsed laser deposition

S. G. Lu; X. H. Zhu; Chee Leung Mak; K. H. Wong; H. L W Chan

Study of compositionally graded epitaxial barium strontium titanate thin films derived from pulsed laser deposition

S. G. Lu, X. H. Zhu, Chee Leung Mak, K. H. Wong, H. L W Chan

Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

Abstract

Epitaxial gradient barium strontium titanate (BaxSr1-x)TiO3 (x=0.75, 0.8, 0.9, 1.0) thin films were prepared through pulsed laser deposition method on the (La0.7Sr0.3)MnO3 (LSMO)/LaAlO3 (LAO) substrate. Their epitaxial structure was characterized via x-ray diffraction (XRD) technique. The gradient change of composition is determined by the energy dispersive analysis of x-ray (EDAX). P-E loops were obtained. The dielectric properties in the frequency ranging from 100 Hz to 100 kHz were measured using an impedance analyzer. Results indicated that the epitaxial structure has good dielectric properties.

Original language	English
Title of host publication	Asia-Pacific Microwave Conference Proceedings, APMC
Pages	338-341
Number of pages	4
Volume	1
Publication status	Published - 1 Dec 2001
Event	2001 Asia-Pacific Microwave Conference - Taipei, Taiwan Duration: 3 Dec 2001 → 6 Dec 2001

Conference

Conference	2001 Asia-Pacific Microwave Conference
Country/Territory	Taiwan
City	Taipei
Period	3/12/01 → 6/12/01

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

@inproceedings{f5c9a9432e834976859057680ba071a9,

title = "Study of compositionally graded epitaxial barium strontium titanate thin films derived from pulsed laser deposition",

abstract = "Epitaxial gradient barium strontium titanate (BaxSr1-x)TiO3 (x=0.75, 0.8, 0.9, 1.0) thin films were prepared through pulsed laser deposition method on the (La0.7Sr0.3)MnO3 (LSMO)/LaAlO3 (LAO) substrate. Their epitaxial structure was characterized via x-ray diffraction (XRD) technique. The gradient change of composition is determined by the energy dispersive analysis of x-ray (EDAX). P-E loops were obtained. The dielectric properties in the frequency ranging from 100 Hz to 100 kHz were measured using an impedance analyzer. Results indicated that the epitaxial structure has good dielectric properties.",

author = "Lu, {S. G.} and Zhu, {X. H.} and Mak, {Chee Leung} and Wong, {K. H.} and Chan, {H. L W}",

year = "2001",

month = dec,

day = "1",

language = "English",

isbn = "0780371380",

volume = "1",

pages = "338--341",

booktitle = "Asia-Pacific Microwave Conference Proceedings, APMC",

note = "2001 Asia-Pacific Microwave Conference ; Conference date: 03-12-2001 Through 06-12-2001",

}

Study of compositionally graded epitaxial barium strontium titanate thin films derived from pulsed laser deposition. / Lu, S. G.; Zhu, X. H.; Mak, Chee Leung et al.
Asia-Pacific Microwave Conference Proceedings, APMC. Vol. 1 2001. p. 338-341.

Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

TY - GEN

T1 - Study of compositionally graded epitaxial barium strontium titanate thin films derived from pulsed laser deposition

AU - Lu, S. G.

AU - Zhu, X. H.

AU - Mak, Chee Leung

AU - Wong, K. H.

AU - Chan, H. L W

PY - 2001/12/1

Y1 - 2001/12/1

N2 - Epitaxial gradient barium strontium titanate (BaxSr1-x)TiO3 (x=0.75, 0.8, 0.9, 1.0) thin films were prepared through pulsed laser deposition method on the (La0.7Sr0.3)MnO3 (LSMO)/LaAlO3 (LAO) substrate. Their epitaxial structure was characterized via x-ray diffraction (XRD) technique. The gradient change of composition is determined by the energy dispersive analysis of x-ray (EDAX). P-E loops were obtained. The dielectric properties in the frequency ranging from 100 Hz to 100 kHz were measured using an impedance analyzer. Results indicated that the epitaxial structure has good dielectric properties.

AB - Epitaxial gradient barium strontium titanate (BaxSr1-x)TiO3 (x=0.75, 0.8, 0.9, 1.0) thin films were prepared through pulsed laser deposition method on the (La0.7Sr0.3)MnO3 (LSMO)/LaAlO3 (LAO) substrate. Their epitaxial structure was characterized via x-ray diffraction (XRD) technique. The gradient change of composition is determined by the energy dispersive analysis of x-ray (EDAX). P-E loops were obtained. The dielectric properties in the frequency ranging from 100 Hz to 100 kHz were measured using an impedance analyzer. Results indicated that the epitaxial structure has good dielectric properties.

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M3 - Conference article published in proceeding or book

SN - 0780371380

VL - 1

SP - 338

EP - 341

BT - Asia-Pacific Microwave Conference Proceedings, APMC

T2 - 2001 Asia-Pacific Microwave Conference

Y2 - 3 December 2001 through 6 December 2001

ER -

Study of compositionally graded epitaxial barium strontium titanate thin films derived from pulsed laser deposition

Abstract

Conference

ASJC Scopus subject areas

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