Study of a super-resolution optical structure: Polycarbonate/ZnS-SiO2/ZnO/ZnS-SiO2/Ge2Sb2 Te5/ZnS-SiO2

W.C. Lin; T.S. Kao; H.H. Chang; Y.H. Lin; Y.H. Fu; C.T. Wu; K.H. Chen; Din-ping Tsai

Study of a super-resolution optical structure: Polycarbonate/ZnS-SiO2/ZnO/ZnS-SiO2/Ge2Sb2 Te5/ZnS-SiO2

W.C. Lin, T.S. Kao, H.H. Chang, Y.H. Lin, Y.H. Fu, C.T. Wu, K.H. Chen, Din-ping Tsai

Research output: Journal article publication › Journal article › Academic research › peer-review

Abstract

A new super-resolution near-field optical structure was demonstrated. The structure, polycarbonate/ZnS-SiO2(130 nm)/ZnO(15 nm)/ZnS-SiO2(30 nm)/Ge2Sb2Te5(15 nm)/ ZnS-SiO2(20 nm), has the ability in recording the small marks beyond the diffraction limit. At a readout power of 5 mW, the carrier to noise ratio (CNR) of more than 33 dB was measured for the recorded marks with the size of 100 nm by a digital versatile disc (DVD) tester. Transmission electron microscope (TEM) images of such structure displayed local orderly nanograins in 15 nm ZnO thin film. Ensemble effects of these ZnO nanostructures of the active layer are the key of the near-field super-resolution.

Original language	English
Pages (from-to)	1029-1030
Number of pages	2
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	42
Issue number	2 B
Publication status	Published - 1 Feb 2003
Externally published	Yes

Keywords

Near-field optics
Super-resolution near-field structure (super-RENS)
ZnO film

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

Cite this

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title = "Study of a super-resolution optical structure: Polycarbonate/ZnS-SiO2/ZnO/ZnS-SiO2/Ge2Sb2 Te5/ZnS-SiO2",

abstract = "A new super-resolution near-field optical structure was demonstrated. The structure, polycarbonate/ZnS-SiO2(130 nm)/ZnO(15 nm)/ZnS-SiO2(30 nm)/Ge2Sb2Te5(15 nm)/ ZnS-SiO2(20 nm), has the ability in recording the small marks beyond the diffraction limit. At a readout power of 5 mW, the carrier to noise ratio (CNR) of more than 33 dB was measured for the recorded marks with the size of 100 nm by a digital versatile disc (DVD) tester. Transmission electron microscope (TEM) images of such structure displayed local orderly nanograins in 15 nm ZnO thin film. Ensemble effects of these ZnO nanostructures of the active layer are the key of the near-field super-resolution.",

keywords = "Near-field optics, Super-resolution near-field structure (super-RENS), ZnO film",

author = "W.C. Lin and T.S. Kao and H.H. Chang and Y.H. Lin and Y.H. Fu and C.T. Wu and K.H. Chen and Din-ping Tsai",

year = "2003",

month = feb,

day = "1",

language = "English",

volume = "42",

pages = "1029--1030",

journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",

issn = "0021-4922",

publisher = "Japan Society of Applied Physics",

number = "2 B",

}

Study of a super-resolution optical structure: Polycarbonate/ZnS-SiO2/ZnO/ZnS-SiO2/Ge2Sb2 Te5/ZnS-SiO2. / Lin, W.C.; Kao, T.S.; Chang, H.H. et al.
In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 42, No. 2 B, 01.02.2003, p. 1029-1030.

Research output: Journal article publication › Journal article › Academic research › peer-review

TY - JOUR

T1 - Study of a super-resolution optical structure: Polycarbonate/ZnS-SiO2/ZnO/ZnS-SiO2/Ge2Sb2 Te5/ZnS-SiO2

AU - Lin, W.C.

AU - Kao, T.S.

AU - Chang, H.H.

AU - Lin, Y.H.

AU - Fu, Y.H.

AU - Wu, C.T.

AU - Chen, K.H.

AU - Tsai, Din-ping

PY - 2003/2/1

Y1 - 2003/2/1

N2 - A new super-resolution near-field optical structure was demonstrated. The structure, polycarbonate/ZnS-SiO2(130 nm)/ZnO(15 nm)/ZnS-SiO2(30 nm)/Ge2Sb2Te5(15 nm)/ ZnS-SiO2(20 nm), has the ability in recording the small marks beyond the diffraction limit. At a readout power of 5 mW, the carrier to noise ratio (CNR) of more than 33 dB was measured for the recorded marks with the size of 100 nm by a digital versatile disc (DVD) tester. Transmission electron microscope (TEM) images of such structure displayed local orderly nanograins in 15 nm ZnO thin film. Ensemble effects of these ZnO nanostructures of the active layer are the key of the near-field super-resolution.

AB - A new super-resolution near-field optical structure was demonstrated. The structure, polycarbonate/ZnS-SiO2(130 nm)/ZnO(15 nm)/ZnS-SiO2(30 nm)/Ge2Sb2Te5(15 nm)/ ZnS-SiO2(20 nm), has the ability in recording the small marks beyond the diffraction limit. At a readout power of 5 mW, the carrier to noise ratio (CNR) of more than 33 dB was measured for the recorded marks with the size of 100 nm by a digital versatile disc (DVD) tester. Transmission electron microscope (TEM) images of such structure displayed local orderly nanograins in 15 nm ZnO thin film. Ensemble effects of these ZnO nanostructures of the active layer are the key of the near-field super-resolution.

KW - Near-field optics

KW - Super-resolution near-field structure (super-RENS)

KW - ZnO film

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M3 - Journal article

SN - 0021-4922

VL - 42

SP - 1029

EP - 1030

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

IS - 2 B

ER -

Study of a super-resolution optical structure: Polycarbonate/ZnS-SiO2/ZnO/ZnS-SiO2/Ge2Sb2 Te5/ZnS-SiO2

Abstract

Keywords

ASJC Scopus subject areas

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