Studies on the retention behavior of SrBi2Ta2O9thin films

Zhigang Zhang, Jinsong Zhu, Jianshe Liu, Xiaomei Lu, Feng Yan, Yening Wang

Research output: Journal article publicationJournal articleAcademic researchpeer-review

2 Citations (Scopus)


The retention properties of SrBi2Ta2O9(SBT) thin films are to be studied. Within the first second, the polarization decay increases with increasing of the write/read voltage, and tends to steady value. This could be ascribed to the depolarization fields, which increases with increasing retained polarization. However, the polarization loss is found to be different with various write/read voltages over a range of 1-30 000 s. The effect of ultra-violet irradiation on SBT retention is also to be investigated. Experiments indicate that there was weak pinning of domain walls existing in SBT.
Original languageEnglish
Pages (from-to)180-183
Number of pages4
JournalThin Solid Films
Issue number1-2
Publication statusPublished - 31 Oct 2000
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry


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