Keyphrases
Structural Properties
100%
Pulsed Laser Deposition
100%
Yttria-stabilized Zirconia
100%
Yttria-stabilized Zirconia Thin Films
100%
Sapphire Substrate
40%
Zirconia Film
40%
Scanning Electron Microscopy
20%
Well-defined
20%
Oxygen Pressure
20%
Diffraction
20%
High-resolution Transmission Electron Microscopy (HRTEM)
20%
Crystal Orientation
20%
Electron Beam Scanning
20%
(111)-oriented
20%
Preferred Orientation Growth
20%
Low Oxygen
20%
Step Processes
20%
High-flow Oxygen
20%
Material Science
Yttria Stabilized Zirconia
100%
Structural Property
100%
Pulsed Laser Deposition
100%
Thin Films
100%
Sapphire
28%
Film
28%
Scanning Electron Microscopy
14%
Nucleation
14%
High-Resolution Transmission Electron Microscopy
14%
Crystal Orientation
14%