Structural and optical properties of wurtzite MgxZn1-xS (0≤x≤0.25) films grown on (0001) Al2O3by pulsed-laser deposition

H. C. Ong, Jiyan Dai

Research output: Journal article publicationJournal articleAcademic researchpeer-review

5 Citations (Scopus)

Abstract

Wurtzite MgxZn1-xS (0≤x≤0.25) thin films have been epitaxially grown on (0001) Al2O3using pulsed-laser deposition. High-quality films can be prepared at a growth temperature of 450-550°C with (0001) ω-rocking curve full width at half maximum as narrow as 0.09°. High-resolution cross-sectional transmission electron microscopy of the films deposited at 500°C shows the presence of the mixture of zinc-blende and wurtzite phases at the interface, and therefore the interfacial region is highly defective. However, above the critical thickness of ∼5 nm, the film bulk consists of pure wurtzite material with a very high level of crystallinity. The band edge of MgxZn1-xS films examined by transmission spectroscopy at room temperature increases from 3.75 eV at x=0 to 3.95 at x=0.25.
Original languageEnglish
Pages (from-to)1444-1446
Number of pages3
JournalApplied Physics Letters
Volume81
Issue number8
DOIs
Publication statusPublished - 19 Aug 2002

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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