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Strengthening brittle semiconductor nanowires through stacking faults: Insights from in situ mechanical testing
Bin Chen, Jun Wang, Qiang Gao, Yujie Chen, Xiaozhou Liao, Chunsheng Lu, Hark Hoe Tan, Yiu Wing Mai, Jin Zou, Simon P. Ringer, Huajian Gao, Chennupati Jagadish
Research output: Journal article publication › Journal article › Academic research › peer-review
45
Citations
(Scopus)