Strain distribution in epitaxial SrTiO3thin films

Z. Y. Zhai; X. S. Wu; Z. S. Jiang; Jianhua Hao; J. Gao; Y. F. Cai; Y. G. Pan

doi:10.1063/1.2424282

Strain distribution in epitaxial SrTiO₃thin films

Z. Y. Zhai, X. S. Wu, Z. S. Jiang, Jianhua Hao, J. Gao, Y. F. Cai, Y. G. Pan

Research output: Journal article publication › Journal article › Academic research › peer-review

22 Citations (Scopus)

Abstract

The lattice strain distributions of epitaxial SrTi O3 films deposited on LaAl O3 were investigated by in situ x-ray diffraction at the temperature range of 25-300 K, grazing incident x-ray diffraction, and high resolution x-ray diffraction. The nearly linear temperature dependence of the out-of-plane lattice constant of SrTi O3 was observed in the measured temperature range. The depth distribution of the lattice strain at room temperature for SrTi O3 films includes the surface layer, strained layer, and interface layer.

Original language	English
Article number	262902
Journal	Applied Physics Letters
Volume	89
Issue number	26
DOIs	https://doi.org/10.1063/1.2424282
Publication status	Published - 1 Dec 2006

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.2424282

http://hdl.handle.net/10397/4623

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AU - Cai, Y. F.

AU - Pan, Y. G.

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AB - The lattice strain distributions of epitaxial SrTi O3 films deposited on LaAl O3 were investigated by in situ x-ray diffraction at the temperature range of 25-300 K, grazing incident x-ray diffraction, and high resolution x-ray diffraction. The nearly linear temperature dependence of the out-of-plane lattice constant of SrTi O3 was observed in the measured temperature range. The depth distribution of the lattice strain at room temperature for SrTi O3 films includes the surface layer, strained layer, and interface layer.

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Strain distribution in epitaxial SrTiO₃thin films

Abstract

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