Split-drain magnetic field-effect transistor channel charge trapping and stress induced sensitivity deterioration

Zhenyi Yang, Sik Lam Siu, Wing Shan Tam, Chi Wah Kok, Chi Wah Leung, P. T. Lai, Hei Wong, Wing Man Tang, P. W.T. Pong

Research output: Journal article publicationJournal articleAcademic researchpeer-review

5 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Split-drain magnetic field-effect transistor channel charge trapping and stress induced sensitivity deterioration'. Together they form a unique fingerprint.

Earth and Planetary Sciences

Physics

Engineering

Material Science

Chemistry