Split-drain magnetic field-effect transistor channel charge trapping and stress induced sensitivity deterioration

  • Z.Y. Yang
  • , S.L. Siu
  • , W.S. Tam
  • , C.W. Kok
  • , Chi Wah Leung
  • , P.T. Lai
  • , H. Wong
  • , W.M. Tang
  • , P.W.T. Pong

Research output: Unpublished conference presentation (presented paper, abstract, poster)Conference presentation (not published in journal/proceeding/book)Academic researchpeer-review

Original languageEnglish
Publication statusPublished - 2013
EventInternational Symposium on Advanced Magnetic Materials and Applications [ISAMMA] -
Duration: 1 Jan 2013 → …

Conference

ConferenceInternational Symposium on Advanced Magnetic Materials and Applications [ISAMMA]
Period1/01/13 → …

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