Split-drain magnetic field-effect transistor channel charge trapping and stress induced sensitivity deterioration

Z.Y. Yang, S.L. Siu, W.S. Tam, C.W. Kok, Chi Wah Leung, P.T. Lai, H. Wong, W.M. Tang, P.W.T. Pong

Research output: Unpublished conference presentation (presented paper, abstract, poster)Conference presentation (not published in journal/proceeding/book)Academic researchpeer-review

Original languageEnglish
Publication statusPublished - 2013
EventInternational Symposium on Advanced Magnetic Materials and Applications [ISAMMA] -
Duration: 1 Jan 2013 → …

Conference

ConferenceInternational Symposium on Advanced Magnetic Materials and Applications [ISAMMA]
Period1/01/13 → …

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