Spectroscopic ellipsometry study of epitaxially grown Pb(Mg_1/3Nb_2/3)O₃-PbTiO₃MgO/TiN/Si heterostructures

Material Science

• Epitaxy 50%
• Heterojunction 100%
• Magnesium Oxide 50%
• Microscopy 50%
• Pulsed Laser Deposition 50%
• Scanning Electron Microscopy 50%
• Structural Property 50%
• Surface Morphology 50%
• Thin Films 50%
• Waveguide 50%
• X-Ray Diffraction 50%

Physics

• Ellipsometry 100%
• Growth 50%
• Optical Waveguides 50%
• Pulsed Laser Deposition 50%
• Scanning Electron Microscopy 50%
• Shapes 50%
• Substrates 50%
• Thin Films 50%
• X Ray Diffraction 50%