Spectroscopic ellipsometry study of epitaxially grown Pb(Mg_1/3Nb_2/3)O₃-PbTiO₃MgO/TiN/Si heterostructures

Keyphrases

• Heterostructure 100%
• Spectroscopic Ellipsometry 100%
• Epitaxially Grown 100%
• Scanning Electron Microscopy 50%
• Structural Properties 50%
• X Ray Diffraction 50%
• Pulsed Laser Deposition 50%
• (001) Substrate 50%
• X-ray Scanning 50%
• Electron Microscopy Techniques 50%
• Si(111) 50%
• Optical Waveguides 50%
• Surface Morphology 50%
• Epitaxial Growth 50%
• Structural Surface 50%

Physics

• Thin Films 100%
• Ellipsometry 100%
• X Ray Diffraction 100%
• Scanning Electron Microscopy 100%
• Optical Waveguides 100%
• Pulsed Laser Deposition 100%

Material Science

• Heterojunction 100%
• Waveguide 50%
• Scanning Electron Microscopy 50%
• Epitaxy 50%
• Surface Morphology 50%
• Structural Property 50%
• Pulsed Laser Deposition 50%
• X-Ray Diffraction 50%
• Magnesium Oxide 50%
• Thin Films 50%