Spectroscopic ellipsometry study of epitaxially grown Pb(Mg1/3Nb2/3)O3-PbTiO3MgO/TiN/Si heterostructures

W. S. Tsang, K. Y. Chan, Chee Leung Mak, K. H. Wong

Research output: Journal article publicationJournal articleAcademic researchpeer-review

26 Citations (Scopus)

Abstract

A study was conducted on the epitaxial growth of thin films on MgO/TiN buffered Si(001) substrates by pulsed laser deposition. X-ray diffraction and scanning electron microscopy techniques were used to study their structural properties and surface morphology. The results showed that these heterostructures form good optical waveguides.
Original languageEnglish
Pages (from-to)1599-1601
Number of pages3
JournalApplied Physics Letters
Volume83
Issue number8
DOIs
Publication statusPublished - 25 Aug 2003

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this