Spectroellipsometric studies of sol-gel derived Sr0.6Ba0.4Nb2O6films

Melanie M.T. Ho, T. B. Tang, Chee Leung Mak, G. K.H. Pang, K. Y. Chan, K. H. Wong

Research output: Journal article publicationJournal articleAcademic researchpeer-review

4 Citations (Scopus)


Sr0.6 Ba0.4 Nb2 O6 (SBN) films have been fabricated on (001)Si substrates by a sol-gel technique. The annealing process was carried out in air at various temperatures ranging from 200 to 700 °C. Studies using x-ray diffractometry, high resolution transmission electron microscopy, and scanning electron microscopy showed that polycrystalline films, with a grain size of about 100 nm, were obtained only for annealing temperatures 600 °C. The optical properties of these sol-gel derived SBN films were studied by spectroscopic ellipsometry (SE). In the analysis of the measured SE spectra, a triple-layer Lorentz model has been developed and used to deduce the optical properties of the SBN films. Our systematic SE measurements revealed that the refractive indices of the SBN films increase with the annealing temperature. This increase is more pronounced at around the crystallization temperature, i.e., between 500 and 600 °C. The extinction coefficients of the films also exhibit a similar trend, showing a zero value for amorphous films and larger values for films annealed at above 600 °C. Our results demonstrate that while crystallization helps to raise the refractive index of the film due to film densification, it also promotes scattering by grain boundary, resulting in a larger extinction coefficient.
Original languageEnglish
Article number083524
JournalJournal of Applied Physics
Issue number8
Publication statusPublished - 7 Nov 2006

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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